Write activity reduction on flash main memory via smart victim cache

  • Liang Shi*
  • , Chun Jason Xue
  • , Jingtong Hu
  • , Wei Che Tseng
  • , Xuehai Zhou
  • , Edwin H.M. Sha
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

50 Scopus citations

Abstract

Flash Memory is a desirable candidate for main memory replacement in embedded systems due to its low leakage power consumption, higher density and non-volatility characteristics. There are two challenges in applying flash memory as main memory. First, the write operations are much slower than read operations. Second, the lifetime of flash memory depends on the number of the write/erase operations. In this paper, we introduce a smart victim cache architecture to reduce the write activities by exploring the coarse grain accessing character of NAND flash memory. Experimental results show that the proposed approaches can reduce write activities on flash main memory by 65.38% on average compared to traditional architecture.

Original languageEnglish
Title of host publicationGLSVLSI'10 - Proceedings of the Great Lakes Symposium on VLSI 2010
Pages91-94
Number of pages4
DOIs
StatePublished - 2010
Externally publishedYes
Event20th Great Lakes Symposium on VLSI, GLSVLSI 2010 - Providence, RI, United States
Duration: 16 May 201018 May 2010

Publication series

NameProceedings of the ACM Great Lakes Symposium on VLSI, GLSVLSI

Conference

Conference20th Great Lakes Symposium on VLSI, GLSVLSI 2010
Country/TerritoryUnited States
CityProvidence, RI
Period16/05/1018/05/10

Keywords

  • cache
  • main memory
  • nand flash memory
  • victim cache

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