Abstract
In recent years, there has been a growing need for accurate, high fidelity scene simulations in the visible, infrared, microwave and other wavelengths. Based on a rigorous material classification and incorporating material attribute information, we generate wavelength independent texture maps for multi-spectral scene simulation. We calculate the sensor radiance value of every pixel, and change them into color or gray. If a single pixel in the texture contains more than one material, we mixture them based on their radiation attribution. According to area consistency and coherence across scan lines, an extended Seed Filling Algorithm is used in those areas with same or similar materials. These optimal steps are performed repeatedly until a satisfactory classification and mixture is found and the texture maps in a certain wave band are obtained. In this way we generate infrared textures from visible maps and different simulation scene textures at different time of a day and under different environment conditions can also be obtained. Finally we give some examples of multi-spectral scene simulation, which are quite satisfied compared with the measured images.
| Original language | English |
|---|---|
| Pages (from-to) | 717-722 |
| Number of pages | 6 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5286 |
| Issue number | 2 |
| DOIs | |
| State | Published - 2003 |
| Externally published | Yes |
| Event | Third International Symposium on Multispectral Image Processing and Pattern Recognition - Beijing, China Duration: 20 Oct 2003 → 22 Oct 2003 |
Keywords
- Material attribute
- Multi-spectral scene simulation
- Seed Filling Algorithm
- Wavelength independent texture