TY - GEN
T1 - Virtual denormalization via array index reference for main memory OLAP
AU - Zhang, Yansong
AU - Zhou, Xuan
AU - Zhang, Ying
AU - Zhang, Yu
AU - Su, Mingchuan
AU - Wang, Shan
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/6/22
Y1 - 2016/6/22
N2 - Denormalization is a common tactic for enhancing performance of data warehouses. However, it is rarely used in main memory databases, which regards storage space as scarce resource. In this paper, we demonstrate that MMDB can actually benefit from the strategy of denormalization. We have created A-Store, a prototypical main-memory database system customized for star and snowflake schemas, which applies the strategy of denormalization to achieve highly efficient OLAP. Instead of resorting to fully materialized denormalization, A-Store applies a method called virtual denomalization, which allows query processing to be performed in a denormalized way, while without incurring additional space consumption.
AB - Denormalization is a common tactic for enhancing performance of data warehouses. However, it is rarely used in main memory databases, which regards storage space as scarce resource. In this paper, we demonstrate that MMDB can actually benefit from the strategy of denormalization. We have created A-Store, a prototypical main-memory database system customized for star and snowflake schemas, which applies the strategy of denormalization to achieve highly efficient OLAP. Instead of resorting to fully materialized denormalization, A-Store applies a method called virtual denomalization, which allows query processing to be performed in a denormalized way, while without incurring additional space consumption.
UR - https://www.scopus.com/pages/publications/84980332277
U2 - 10.1109/ICDE.2016.7498387
DO - 10.1109/ICDE.2016.7498387
M3 - 会议稿件
AN - SCOPUS:84980332277
T3 - 2016 IEEE 32nd International Conference on Data Engineering, ICDE 2016
SP - 1486
EP - 1487
BT - 2016 IEEE 32nd International Conference on Data Engineering, ICDE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 32nd IEEE International Conference on Data Engineering, ICDE 2016
Y2 - 16 May 2016 through 20 May 2016
ER -