Abstract
Nd3+-doped GeO2-SiO2 thin films are prepared by a sol-gel spin-coating process for photonic applications. Acid-catalyzed solutions of γ-glycidoxypropyltrimethoxysilane mixed with gemanium isopropoxide are used as matrix precursors. Thermal gravimetric analysis, UV-visible spectroscopy, and Fourier transform infrared spectroscopy are used to study the structural and optical properties of the thin films. The results indicate that crack-free and high transparency in the visible and near infrared range thin films with a thickness of about 0.7 μm can be obtained by a single spin-coating process after a heat treatment at 500 °C. A strong UV absorption region at short wavelength ∼200 nm, accompanied with a shoulder peak at ∼240 nm due to the neutral oxygen monovacancies defects, is also identified. The effect of Nd3+ doping concentration on up-conversion emission of the thin films is studied. An intense room-temperature violet up-conversion emission at 397 nm is observed from the thin film with an optimum Nd3+ concentration of 0.5 mol% upon excitation with a xenon lamp at the wavelength of 586 nm. In addition to this intense violet emission, a relative weak ultraviolet emission at 372 nm and a blue emission at 469 nm are also observed.
| Original language | English |
|---|---|
| Pages (from-to) | 75-78 |
| Number of pages | 4 |
| Journal | Journal of Crystal Growth |
| Volume | 288 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2 Feb 2006 |
| Event | International Conference on Materials for Advanced Technologies - Duration: 4 Jul 2005 → 8 Jul 2005 |
Keywords
- A1. Fourier transform infrared spectroscopy
- A1. Up-conversion
- A2. Sol-gel coatings
- B1. Germania-silica