TY - JOUR
T1 - Tuning of threshold voltage in organic field-effect transistor by dipole monolayer
AU - Ou-Yang, Wei
AU - Chen, Xiangyu
AU - Weis, Martin
AU - Manaka, Takaaki
AU - Iwamotoy, Mitsumasa
PY - 2010/4
Y1 - 2010/4
N2 - We have studied the threshold voltage shift of top-contact organic field-effect transistors (OFETs) with a dipole monolayer between pentacene active layer and SiO2 gate insulator. Since dipole moment projection in normal of the monolayer can be regulated by changing the ordering, the relationship between threshold voltage shift and spontaneous polarization of the monolayer has been gained. Experimental results show the dipole monolayer causes a large negative threshold voltage shift and the shift is linearly proportional to the polarization of the monolayer. We propose a dipole layer model to interpret the observed phenomena with an assumption that the threshold voltage shift is due to compensation of electric field in organic semiconductor layer induced by the dipole monolayer, which is uncommon for the general consideration. Excitingly, a good agreement between the experiment and the analysis shows validity of our modeling and provides the capability of tuning threshold voltage for OFET devices.
AB - We have studied the threshold voltage shift of top-contact organic field-effect transistors (OFETs) with a dipole monolayer between pentacene active layer and SiO2 gate insulator. Since dipole moment projection in normal of the monolayer can be regulated by changing the ordering, the relationship between threshold voltage shift and spontaneous polarization of the monolayer has been gained. Experimental results show the dipole monolayer causes a large negative threshold voltage shift and the shift is linearly proportional to the polarization of the monolayer. We propose a dipole layer model to interpret the observed phenomena with an assumption that the threshold voltage shift is due to compensation of electric field in organic semiconductor layer induced by the dipole monolayer, which is uncommon for the general consideration. Excitingly, a good agreement between the experiment and the analysis shows validity of our modeling and provides the capability of tuning threshold voltage for OFET devices.
UR - https://www.scopus.com/pages/publications/77952729085
U2 - 10.1143/JJAP.49.04DK04
DO - 10.1143/JJAP.49.04DK04
M3 - 文章
AN - SCOPUS:77952729085
SN - 0021-4922
VL - 49
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
IS - 4 PART 2
M1 - 04DK04
ER -