Skip to main navigation Skip to search Skip to main content

Tuning etch selectivity of fused silica irradiated by femtosecond laser pulses by controlling polarization of the writing pulses

  • Xiaoming Yu*
  • , Yang Liao
  • , Fei He
  • , Bin Zeng
  • , Ya Cheng
  • , Zhizhan Xu
  • , Koji Sugioka
  • , Katsumi Midorikawa
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Optics and Fine Mechanics
  • University of Chinese Academy of Sciences
  • RIKEN

Research output: Contribution to journalArticlepeer-review

Abstract

We report on experimental study on chemical etch selectivity of fused silica irradiated by femtosecond laser with either linear or circular polarization in a wide range of pulse energies. The relationships between the etch rates and pulse energies are obtained for different polarization states, which can be divided into three different regions. A drop of the etch rate for high pulse energy region is observed and the underlying mechanism is discussed. The advantage of using circularly polarized laser is justified owing to its unique capability of providing a 3D isotropic etch rate.

Original languageEnglish
Article number053114
JournalJournal of Applied Physics
Volume109
Issue number5
DOIs
StatePublished - 1 Mar 2011
Externally publishedYes

Fingerprint

Dive into the research topics of 'Tuning etch selectivity of fused silica irradiated by femtosecond laser pulses by controlling polarization of the writing pulses'. Together they form a unique fingerprint.

Cite this