TY - GEN
T1 - Tuner-based and F50 Measurement of HEMT Noise Parameters Determining
AU - Lyu, Yuanting
AU - Li, Zhichun
AU - Zhang, Ao
AU - Gao, Jianjun
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - In this paper, we discuss the tuner-based measurement and $\mathrm{F}_{50}$ method for characterizing four noise parameters of HEMT devices. General processes and requirements demanded for each method are introduced and compared. The noise parameters obtained by the two extraction methods shows similar results for 70 nm HEMT with 50 μm gatewidth in the frequency range 8-50GHz. The results indicate that both methods have their own advantages and disadvantages while maintaining accuracy. Based on the F50 noise parameter extraction method, an improvement direction has been proposed to reduce parameter extraction and optimize the process. Great usability is demonstrated for determination of noise parameters characterization.
AB - In this paper, we discuss the tuner-based measurement and $\mathrm{F}_{50}$ method for characterizing four noise parameters of HEMT devices. General processes and requirements demanded for each method are introduced and compared. The noise parameters obtained by the two extraction methods shows similar results for 70 nm HEMT with 50 μm gatewidth in the frequency range 8-50GHz. The results indicate that both methods have their own advantages and disadvantages while maintaining accuracy. Based on the F50 noise parameter extraction method, an improvement direction has been proposed to reduce parameter extraction and optimize the process. Great usability is demonstrated for determination of noise parameters characterization.
UR - https://www.scopus.com/pages/publications/105011956706
U2 - 10.1109/RFIT60557.2024.10812461
DO - 10.1109/RFIT60557.2024.10812461
M3 - 会议稿件
AN - SCOPUS:105011956706
T3 - 2024 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2024 - Proceedings
BT - 2024 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2024 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 IEEE International Symposium on Radio-Frequency Integration Technology, RFIT 2024
Y2 - 28 August 2024 through 30 August 2024
ER -