Transport properties of InAlAs/InGaAs metamorphic high electron mobility transistors on GaAs substrate

  • C. P. Jiang
  • , X. J. Li
  • , S. L. Guo
  • , Q. Sun
  • , Z. M. Huang
  • , J. H. Chu

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

Variable magnetic field Hall measurement has been used to investigate the transport properties in InAlAs/InGaAs metamorphic high electron mobility transistors (MMHEMT) on GaAs substrate in the temperature range from 1.5 to 90K. The experimental data have been analyzed by using a hybrid approach consisting of the mobility spectrum (MS) technique followed by a multi-carrier fitting (MCF) procedure. Both the Shubnikov-de Haas measurements and the hybrid MS+MCF approach show two-dimensional electronic behavior. The two-dimensional electrons, with mobility ∼3×104cm2/Vs and a sheet density ∼2.3×1012cm-2, are obtained and come from the quantum well. The temperature dependent evolution of the electron mobility indicates that alloy scattering dominates at higher temperature.

Original languageEnglish
Title of host publication2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings
EditorsHiroshi Iwai, Xin-Ping Qu, Bing-Zong Li, Guo-Ping Ru, Paul Yu
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1077-1080
Number of pages4
ISBN (Electronic)0780365208, 9780780365209
DOIs
StatePublished - 2001
Externally publishedYes
Event6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Shanghai, China
Duration: 22 Oct 200125 Oct 2001

Publication series

Name2001 6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001 - Proceedings
Volume2

Conference

Conference6th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2001
Country/TerritoryChina
CityShanghai
Period22/10/0125/10/01

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