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Transient decay of photoexcited carriers and photoluminescence efficiency in quantum wells

  • Shi Rong Jin*
  • , Ai Zhen Li
  • , Jun Hao Chu
  • , Shi Wei Chen
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Microsystem and Information Technology
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

We present a phenomenological model for the recombination of photoexcited carriers in quantum wells, which takes into account of the nonradiative recombination and the screening effect of free carriers in the wells. The results show, that the decay time of photoluminescence is strongly related to the sample quality, doping level, as well as the excitation intensity.

Original languageEnglish
Pages (from-to)1009-1010
Number of pages2
JournalWuli Xuebao/Acta Physica Sinica
Volume46
Issue number5
StatePublished - May 1997
Externally publishedYes

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