Transient current study on Pt/TiO2-x/Pt capacitor

Ni Zhong; Hisashi Shima; Hiro Akinaga

doi:10.1143/JJAP.49.04DJ15

Transient current study on Pt/TiO_2-x/Pt capacitor

Ni Zhong^*
, Hisashi Shima
, Hiro Akinaga

^*Corresponding author for this work

National Institute of Advanced Industrial Science and Technology
Japan Science and Technology Agency

Research output: Contribution to journal › Article › peer-review

4 Scopus citations

Abstract

Transient transport characteristic has been studied in the Pt/TiO _2-x /Pt devices. A peak in the current density-time (J-t ) curve was observed under direct-current (dc) electric field stress. The peak position (τ) was investigated as a function of various dc field stress and measurement temperature (T). With increase of field stress and T, τ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO_2-x /Pt device does not come from the oxygen vacancy (V_o) migration directly, but the electron/hole transport. The peak in the J-t curve is attributed to the change of electron/hole conduction caused by V_o redistribution under dc field stress.

Original language	English
Article number	04DJ15
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	49
Issue number	4 PART 2
DOIs	https://doi.org/10.1143/JJAP.49.04DJ15
State	Published - Apr 2010
Externally published	Yes

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title = "Transient current study on Pt/TiO2-x/Pt capacitor",

abstract = "Transient transport characteristic has been studied in the Pt/TiO 2-x /Pt devices. A peak in the current density-time (J-t ) curve was observed under direct-current (dc) electric field stress. The peak position (τ) was investigated as a function of various dc field stress and measurement temperature (T). With increase of field stress and T, τ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO2-x /Pt device does not come from the oxygen vacancy (Vo) migration directly, but the electron/hole transport. The peak in the J-t curve is attributed to the change of electron/hole conduction caused by Vo redistribution under dc field stress.",

author = "Ni Zhong and Hisashi Shima and Hiro Akinaga",

year = "2010",

month = apr,

doi = "10.1143/JJAP.49.04DJ15",

language = "英语",

volume = "49",

journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers",

issn = "0021-4922",

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T1 - Transient current study on Pt/TiO2-x/Pt capacitor

AU - Zhong, Ni

AU - Shima, Hisashi

AU - Akinaga, Hiro

PY - 2010/4

Y1 - 2010/4

N2 - Transient transport characteristic has been studied in the Pt/TiO 2-x /Pt devices. A peak in the current density-time (J-t ) curve was observed under direct-current (dc) electric field stress. The peak position (τ) was investigated as a function of various dc field stress and measurement temperature (T). With increase of field stress and T, τ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO2-x /Pt device does not come from the oxygen vacancy (Vo) migration directly, but the electron/hole transport. The peak in the J-t curve is attributed to the change of electron/hole conduction caused by Vo redistribution under dc field stress.

AB - Transient transport characteristic has been studied in the Pt/TiO 2-x /Pt devices. A peak in the current density-time (J-t ) curve was observed under direct-current (dc) electric field stress. The peak position (τ) was investigated as a function of various dc field stress and measurement temperature (T). With increase of field stress and T, τ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO2-x /Pt device does not come from the oxygen vacancy (Vo) migration directly, but the electron/hole transport. The peak in the J-t curve is attributed to the change of electron/hole conduction caused by Vo redistribution under dc field stress.

UR - https://www.scopus.com/pages/publications/77952705187

U2 - 10.1143/JJAP.49.04DJ15

DO - 10.1143/JJAP.49.04DJ15

M3 - 文章

AN - SCOPUS:77952705187

SN - 0021-4922

VL - 49

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

IS - 4 PART 2

M1 - 04DJ15

ER -

Transient current study on Pt/TiO_2-x/Pt capacitor

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