Transient current study on Pt/TiO2-x/Pt capacitor

  • Ni Zhong*
  • , Hisashi Shima
  • , Hiro Akinaga
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

3 Scopus citations

Abstract

Transient transport characteristic has been studied in the Pt/TiO 2-x /Pt devices. A peak in the current density-time (J-t ) curve was observed under direct-current (dc) electric field stress. The peak position (τ) was investigated as a function of various dc field stress and measurement temperature (T). With increase of field stress and T, τ exhibits a decrease. After analyzing the present result according to space-charge-limited current (SCLC) theory and electron/hole conduction influenced mode, we concluded that the transient current of Pt/TiO2-x /Pt device does not come from the oxygen vacancy (Vo) migration directly, but the electron/hole transport. The peak in the J-t curve is attributed to the change of electron/hole conduction caused by Vo redistribution under dc field stress.

Original languageEnglish
Article number04DJ15
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume49
Issue number4 PART 2
DOIs
StatePublished - Apr 2010
Externally publishedYes

Fingerprint

Dive into the research topics of 'Transient current study on Pt/TiO2-x/Pt capacitor'. Together they form a unique fingerprint.

Cite this