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Thickness and mosaic morphology of InAs films grown by LPE supercooling technique

  • H. Y. Deng*
  • , Q. W. Wang
  • , J. Wu
  • , S. H. Hu
  • , X. Chen
  • , N. Dai
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

InAs films with different thicknesses were fabricated on (100)-oriented InAs substrate by liquid phase epitaxy supercooling technique using the sliding graphite boat. The X-ray diffraction measurement shows that films exhibit (100)-preferred crystal orientation. The film thickness dependence on the growth time and cooling rate was investigated by scanning electron microscope and the growth kinetics was analyzed based on one-dimensional diffusion theory. The experimental data were fitted very well by the supercooling equation, and the fitted diffusion coefficient at 520 °C was 6.2 9 10 -5 cm 2/s. The newly observed mosaic morphology was probably caused by the shake of the growth solution due to sliding the graphite boat.

Original languageEnglish
Pages (from-to)811-814
Number of pages4
JournalJournal of Materials Science: Materials in Electronics
Volume22
Issue number7
DOIs
StatePublished - Jul 2011
Externally publishedYes

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