The third-order optical nonlinearity of Bi3.25La 0.75Ti3O12 ferroelectric thin film on quartz

  • F. W. Shi*
  • , X. J. Meng
  • , G. S. Wang
  • , J. L. Sun
  • , T. Lin
  • , J. H. Ma
  • , Y. W. Li
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

29 Scopus citations

Abstract

Bi3.25La0.75Ti3O12 (BLT) thin film was prepared on quartz substrates using chemical solution deposition. The sign and magnitude of both real and imaginary parts of third-order nonlinear susceptibility χ(3) of the BLT thin film have been determined by the Z-scan technique performed at 800 nm with a femtosecond laser. The nonlinear refractive index coefficient γ and the nonlinear absorption coefficient β of the BLT thin film are - 1.915 × 10- 12 cm2 / W and - 6.764 × 10- 8 m/W, respectively, the real part and imaginary part of the third-order nonlinear susceptibility χ(3) of the BLT thin film are - 5.81 × 10- 18 m2 / V 2 and - 1.31 × 10- 18 m2 / V2, respectively. Both the real and the imaginary parts of the third-order nonlinear susceptibility χ(3) contribute to the nonlinearity of the film. These experimental results show that BLT thin film is a promising material for applications in nonlinear optical devices.

Original languageEnglish
Pages (from-to)333-335
Number of pages3
JournalThin Solid Films
Volume496
Issue number2
DOIs
StatePublished - 21 Feb 2006
Externally publishedYes

Keywords

  • Ferroelectric thin film
  • Optical properties
  • Sol-gel

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