The structural and optical properties of ZnxNi(1-x)Mn2O4 films grown on Pt/Ti/SiO2/Si substrate

Wan Sheng Wang; Yun Hou; Zeng Hui Zhang; Wei Zhou; Yan Qing Gao; Jing Wu; Jun Hao Chu

doi:10.11972/j.issn.1001-9014.2016.06.008

The structural and optical properties of Zn_xNi_(1-x)Mn₂O₄ films grown on Pt/Ti/SiO₂/Si substrate

Wan Sheng Wang
, Yun Hou^*
, Zeng Hui Zhang
, Wei Zhou
, Yan Qing Gao
, Jing Wu
, Jun Hao Chu

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

The spinel oxide Zn_xNi_1-xMn₂O₄ (ZNMO, x=0, 0.05, 0.1, 0.15, 0.2, 0.25) films have been grown on Pt/Ti/SiO₂/Si substrate by chemical solution deposition (CSD) method. The crystallization and microstructural features of ZNMO films are studied by x-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM) analysis, respectively. The results show that the structural property of ZNMO films is affected by Zn concentration. The optical constants of ZNMO films have been analyzed by spectroscopic ellipsometry measurements in the wavelength range of 300-1 100 nm. The changes of the refractive index n and extinction coefficient k caused by Zn substituting are discussed. The A_1g and F_2g modes have been observed in Raman spectra. The relative intensity of the A_1g mode decreases with increasing Zn concentration. The Raman peak positions shift slightly with Zn concentration x, which might result from lattice strain and lattice mismatch.

Original language	English
Pages (from-to)	676-680
Number of pages	5
Journal	Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume	35
Issue number	6
DOIs	https://doi.org/10.11972/j.issn.1001-9014.2016.06.008
State	Published - 1 Dec 2016
Externally published	Yes

Keywords

Optical constants
Raman spectra
Spinel oxide
Structural property

Access to Document

10.11972/j.issn.1001-9014.2016.06.008

Cite this

@article{a428534bcd95405987788bf1bf7682c6,

title = "The structural and optical properties of ZnxNi(1-x)Mn2O4 films grown on Pt/Ti/SiO2/Si substrate",

abstract = "The spinel oxide ZnxNi1-xMn2O4 (ZNMO, x=0, 0.05, 0.1, 0.15, 0.2, 0.25) films have been grown on Pt/Ti/SiO2/Si substrate by chemical solution deposition (CSD) method. The crystallization and microstructural features of ZNMO films are studied by x-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM) analysis, respectively. The results show that the structural property of ZNMO films is affected by Zn concentration. The optical constants of ZNMO films have been analyzed by spectroscopic ellipsometry measurements in the wavelength range of 300-1 100 nm. The changes of the refractive index n and extinction coefficient k caused by Zn substituting are discussed. The A1g and F2g modes have been observed in Raman spectra. The relative intensity of the A1g mode decreases with increasing Zn concentration. The Raman peak positions shift slightly with Zn concentration x, which might result from lattice strain and lattice mismatch.",

keywords = "Optical constants, Raman spectra, Spinel oxide, Structural property",

author = "Wang, \{Wan Sheng\} and Yun Hou and Zhang, \{Zeng Hui\} and Wei Zhou and Gao, \{Yan Qing\} and Jing Wu and Chu, \{Jun Hao\}",

year = "2016",

month = dec,

day = "1",

doi = "10.11972/j.issn.1001-9014.2016.06.008",

language = "英语",

volume = "35",

pages = "676--680",

journal = "Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves",

issn = "1001-9014",

publisher = "Chinese Optical Society",

number = "6",

}

TY - JOUR

T1 - The structural and optical properties of ZnxNi(1-x)Mn2O4 films grown on Pt/Ti/SiO2/Si substrate

AU - Wang, Wan Sheng

AU - Hou, Yun

AU - Zhang, Zeng Hui

AU - Zhou, Wei

AU - Gao, Yan Qing

AU - Wu, Jing

AU - Chu, Jun Hao

PY - 2016/12/1

Y1 - 2016/12/1

N2 - The spinel oxide ZnxNi1-xMn2O4 (ZNMO, x=0, 0.05, 0.1, 0.15, 0.2, 0.25) films have been grown on Pt/Ti/SiO2/Si substrate by chemical solution deposition (CSD) method. The crystallization and microstructural features of ZNMO films are studied by x-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM) analysis, respectively. The results show that the structural property of ZNMO films is affected by Zn concentration. The optical constants of ZNMO films have been analyzed by spectroscopic ellipsometry measurements in the wavelength range of 300-1 100 nm. The changes of the refractive index n and extinction coefficient k caused by Zn substituting are discussed. The A1g and F2g modes have been observed in Raman spectra. The relative intensity of the A1g mode decreases with increasing Zn concentration. The Raman peak positions shift slightly with Zn concentration x, which might result from lattice strain and lattice mismatch.

AB - The spinel oxide ZnxNi1-xMn2O4 (ZNMO, x=0, 0.05, 0.1, 0.15, 0.2, 0.25) films have been grown on Pt/Ti/SiO2/Si substrate by chemical solution deposition (CSD) method. The crystallization and microstructural features of ZNMO films are studied by x-ray diffraction (XRD) and field-emission scanning electron microscopy (FESEM) analysis, respectively. The results show that the structural property of ZNMO films is affected by Zn concentration. The optical constants of ZNMO films have been analyzed by spectroscopic ellipsometry measurements in the wavelength range of 300-1 100 nm. The changes of the refractive index n and extinction coefficient k caused by Zn substituting are discussed. The A1g and F2g modes have been observed in Raman spectra. The relative intensity of the A1g mode decreases with increasing Zn concentration. The Raman peak positions shift slightly with Zn concentration x, which might result from lattice strain and lattice mismatch.

KW - Optical constants

KW - Raman spectra

KW - Spinel oxide

KW - Structural property

UR - https://www.scopus.com/pages/publications/85008391893

U2 - 10.11972/j.issn.1001-9014.2016.06.008

DO - 10.11972/j.issn.1001-9014.2016.06.008

M3 - 文章

AN - SCOPUS:85008391893

SN - 1001-9014

VL - 35

SP - 676

EP - 680

JO - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

JF - Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves

IS - 6

ER -

The structural and optical properties of Zn_xNi_(1-x)Mn₂O₄ films grown on Pt/Ti/SiO₂/Si substrate

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this