The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing

C. Y. Duan; X. P. Qiu; B. Ma; Z. Z. Zhang; Q. Y. Jin

doi:10.1016/j.mseb.2009.04.005

The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing

C. Y. Duan
, X. P. Qiu
, B. Ma^*
, Z. Z. Zhang
, Q. Y. Jin

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

21 Scopus citations

Abstract

The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ₂-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization M_S increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn₆₀Al₄₀ films.

Original language	English
Pages (from-to)	185-188
Number of pages	4
Journal	Materials Science and Engineering: B
Volume	162
Issue number	3
DOIs	https://doi.org/10.1016/j.mseb.2009.04.005
State	Published - 15 Jun 2009
Externally published	Yes

Keywords

Annealing
Interface
Multilayers
τ-MnAl

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10.1016/j.mseb.2009.04.005

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title = "The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing",

abstract = "The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ2-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn60Al40 films.",

keywords = "Annealing, Interface, Multilayers, τ-MnAl",

author = "Duan, \{C. Y.\} and Qiu, \{X. P.\} and B. Ma and Zhang, \{Z. Z.\} and Jin, \{Q. Y.\}",

year = "2009",

month = jun,

day = "15",

doi = "10.1016/j.mseb.2009.04.005",

language = "英语",

volume = "162",

pages = "185--188",

journal = "Materials Science and Engineering: B",

issn = "0921-5107",

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}

TY - JOUR

T1 - The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing

AU - Duan, C. Y.

AU - Qiu, X. P.

AU - Ma, B.

AU - Zhang, Z. Z.

AU - Jin, Q. Y.

PY - 2009/6/15

Y1 - 2009/6/15

N2 - The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ2-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn60Al40 films.

AB - The structural and magnetic properties of τ-MnAl alloy films are studied. The films are derived by annealing from Mn/Al multilayers. τ-MnAl appears when the annealing temperature increases up to 350 °C, but decomposes into γ2-MnAl and β-Mn at 500 °C annealing. Good magnetic properties are obtained after 400-450 °C annealing. Furthermore, τ-MnAl forms in the Mn-Al interface. The saturation magnetization MS increases first with the thickness of Mn (or Al) layers, and then decreases in inverse proportion to that of Mn (or Al) layers. The turning point implies that the thickness of τ-MnAl is no more than 5 nm in the Mn60Al40 films.

KW - Annealing

KW - Interface

KW - Multilayers

KW - τ-MnAl

UR - https://www.scopus.com/pages/publications/67649429824

U2 - 10.1016/j.mseb.2009.04.005

DO - 10.1016/j.mseb.2009.04.005

M3 - 文章

AN - SCOPUS:67649429824

SN - 0921-5107

VL - 162

SP - 185

EP - 188

JO - Materials Science and Engineering: B

JF - Materials Science and Engineering: B

IS - 3

ER -

The structural and magnetic properties of τ-MnAl films prepared by Mn/Al multilayers deposition plus annealing

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Keywords

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