Abstract
We report the effect of gap states on energy level alignment in a typical organic charge generation interface of N,N-bis(1-naphthyl)-N,N-diphenyl-1,1-biphenyl-4,4-diamine (α-NPD)/hexaazatriphenylene-hexacarbonitrile [HAT(CN)6] by using ultraviolet and X-ray photoemission spectroscopy. The gap states tailed from the highest occupied molecular orbital (HOMO) onset of α-NPD dominate the Fermi level pinning at the α-NPD(<1.6 nm)/HAT(CN)6 interface, which is favorable for charges generation upon bias operation and facilitates the electron injection from the HOMO-tail region of α-NPD to the lowest unoccupied molecular orbital (LUMO) region of HAT(CN)6.
| Original language | English |
|---|---|
| Pages (from-to) | 120-124 |
| Number of pages | 5 |
| Journal | Organic Electronics |
| Volume | 24 |
| DOIs | |
| State | Published - 3 Jun 2015 |
| Externally published | Yes |
Keywords
- Charge generation layer
- Energy level alignment
- Gap states
- Ultraviolet photoelectron spectroscopy
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