The mechanism of Pt films to suppress the electron emission of grid in TWTs

Tianjun Li; Tao Feng; Bingyao Jiang; Xianghuai Liu; Yiwei Chen; Zhuo Sun

doi:10.1002/pssc.201084159

The mechanism of Pt films to suppress the electron emission of grid in TWTs

Tianjun Li
, Tao Feng^*
, Bingyao Jiang
, Xianghuai Liu
, Yiwei Chen
, Zhuo Sun

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Pt films were deposited onto molybdenum grids by ion-beam-assisted deposition (IBAD) method. Electron-emission characteristics of molybdenum, with and without Pt films, contaminated by active electron-emission substances (Ba and BaO) were measured by analogous diode method. X-ray diffraction (XRD) and combined thermogravimetry/differential thermal analysis/mass spectrometry (TG-DTA-MS) were used to study the reaction between Pt and BaO in simulation experiments. The results showed that the emission current from an Mo grid coated with a Pt film is much less than that from Mo grid without a film, and the mechanism for electron emission suppression of the molybdenum grid coated with Pt films was discussed.

Original language	English
Pages (from-to)	32-35
Number of pages	4
Journal	Physica Status Solidi (C) Current Topics in Solid State Physics
Volume	9
Issue number	1
DOIs	https://doi.org/10.1002/pssc.201084159
State	Published - Jan 2012
Externally published	Yes

Keywords

Differential thermal analysis (DTA)
Ion beam-assisted deposition
Thermogravimetric analysis (TGA)
Thin films

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10.1002/pssc.201084159

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title = "The mechanism of Pt films to suppress the electron emission of grid in TWTs",

abstract = "Pt films were deposited onto molybdenum grids by ion-beam-assisted deposition (IBAD) method. Electron-emission characteristics of molybdenum, with and without Pt films, contaminated by active electron-emission substances (Ba and BaO) were measured by analogous diode method. X-ray diffraction (XRD) and combined thermogravimetry/differential thermal analysis/mass spectrometry (TG-DTA-MS) were used to study the reaction between Pt and BaO in simulation experiments. The results showed that the emission current from an Mo grid coated with a Pt film is much less than that from Mo grid without a film, and the mechanism for electron emission suppression of the molybdenum grid coated with Pt films was discussed.",

keywords = "Differential thermal analysis (DTA), Ion beam-assisted deposition, Thermogravimetric analysis (TGA), Thin films",

author = "Tianjun Li and Tao Feng and Bingyao Jiang and Xianghuai Liu and Yiwei Chen and Zhuo Sun",

year = "2012",

month = jan,

doi = "10.1002/pssc.201084159",

language = "英语",

volume = "9",

pages = "32--35",

journal = "Physica Status Solidi (C) Current Topics in Solid State Physics",

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publisher = "Wiley-VCH Verlag",

number = "1",

}

TY - JOUR

T1 - The mechanism of Pt films to suppress the electron emission of grid in TWTs

AU - Li, Tianjun

AU - Feng, Tao

AU - Jiang, Bingyao

AU - Liu, Xianghuai

AU - Chen, Yiwei

AU - Sun, Zhuo

PY - 2012/1

Y1 - 2012/1

N2 - Pt films were deposited onto molybdenum grids by ion-beam-assisted deposition (IBAD) method. Electron-emission characteristics of molybdenum, with and without Pt films, contaminated by active electron-emission substances (Ba and BaO) were measured by analogous diode method. X-ray diffraction (XRD) and combined thermogravimetry/differential thermal analysis/mass spectrometry (TG-DTA-MS) were used to study the reaction between Pt and BaO in simulation experiments. The results showed that the emission current from an Mo grid coated with a Pt film is much less than that from Mo grid without a film, and the mechanism for electron emission suppression of the molybdenum grid coated with Pt films was discussed.

AB - Pt films were deposited onto molybdenum grids by ion-beam-assisted deposition (IBAD) method. Electron-emission characteristics of molybdenum, with and without Pt films, contaminated by active electron-emission substances (Ba and BaO) were measured by analogous diode method. X-ray diffraction (XRD) and combined thermogravimetry/differential thermal analysis/mass spectrometry (TG-DTA-MS) were used to study the reaction between Pt and BaO in simulation experiments. The results showed that the emission current from an Mo grid coated with a Pt film is much less than that from Mo grid without a film, and the mechanism for electron emission suppression of the molybdenum grid coated with Pt films was discussed.

KW - Differential thermal analysis (DTA)

KW - Ion beam-assisted deposition

KW - Thermogravimetric analysis (TGA)

KW - Thin films

UR - https://www.scopus.com/pages/publications/83755185605

U2 - 10.1002/pssc.201084159

DO - 10.1002/pssc.201084159

M3 - 文章

AN - SCOPUS:83755185605

SN - 1862-6351

VL - 9

SP - 32

EP - 35

JO - Physica Status Solidi (C) Current Topics in Solid State Physics

JF - Physica Status Solidi (C) Current Topics in Solid State Physics

IS - 1

ER -

The mechanism of Pt films to suppress the electron emission of grid in TWTs

Abstract

Keywords

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