TY - JOUR
T1 - The influence of La content on properties of PLZT thin films
AU - Sun, Qian
AU - Deng, Hongmei
AU - Li, Xiaoxi
AU - Yang, Pingxiong
AU - Chu, Junhao
PY - 2011
Y1 - 2011
N2 - The polycrystalline complex compounds of PLZT, the formula (Pb 1-xLax)(Zr0.52Ti0.48)O3 (x = 0.10, 0.15, 0.20 and 0.25), were fabricated by sol-gel method. the influence of La content on the microstructure, optical properties and electrical properties of PLZT materials were studied. Phase characterization and crystal orientation of the PLZT films was investigated by X-ray diffraction analysis. The extinction coefficient k of the films drops dramatically in the range of 300-500 nm, and reduces to 0.0355, 0.0357 and 0.0451 with the La concentration of 15%, 20% and 25%, respectively, when the wavelength is larger than 550 nm. The remnant polarization of the films decreases with the La content increasing.
AB - The polycrystalline complex compounds of PLZT, the formula (Pb 1-xLax)(Zr0.52Ti0.48)O3 (x = 0.10, 0.15, 0.20 and 0.25), were fabricated by sol-gel method. the influence of La content on the microstructure, optical properties and electrical properties of PLZT materials were studied. Phase characterization and crystal orientation of the PLZT films was investigated by X-ray diffraction analysis. The extinction coefficient k of the films drops dramatically in the range of 300-500 nm, and reduces to 0.0355, 0.0357 and 0.0451 with the La concentration of 15%, 20% and 25%, respectively, when the wavelength is larger than 550 nm. The remnant polarization of the films decreases with the La content increasing.
UR - https://www.scopus.com/pages/publications/79953900409
U2 - 10.1088/1742-6596/276/1/012186
DO - 10.1088/1742-6596/276/1/012186
M3 - 文章
AN - SCOPUS:79953900409
SN - 1742-6588
VL - 276
JO - Journal of Physics: Conference Series
JF - Journal of Physics: Conference Series
IS - 1
M1 - 012186
ER -