The creep process of the domain switching in poly(vinylidene fluoride-trifluoroethylene) ferroelectric thin films

  • B. B. Tian*
  • , Z. H. Chen
  • , A. Q. Jiang
  • , X. L. Zhao
  • , B. L. Liu
  • , J. L. Wang
  • , L. Han
  • , Sh Sun
  • , J. L. Sun
  • , X. J. Meng
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Scopus citations

Abstract

The polarization switching behavior in poly(vinylidene fluoride- trifluoroethylene) thin films is studied by using a pulse transient current method. The dependence of the domain switching current on the coercive electric field was investigated. The charging current around the coercive field was found to be limited by domain switching instead of the series resistor in the measurement circuit because of the slow polarization switching in the films. The domain-switching process was explained by a creep model wherein the two-dimension domain walls motion in the transverse direction dominates the polarization switching process.

Original languageEnglish
Article number042909
JournalApplied Physics Letters
Volume103
Issue number4
DOIs
StatePublished - 22 Jul 2013
Externally publishedYes

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