The charge character in the double-barrier quantum dots in well hybrid structure

X. B. Jin, F. M. Guo, F. Y. Yue

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present the carrier transport properties in the double-barrier InAs quantum dots and InGaAs quantum well hybrid structure of the photoelectric device and analyze the capacitance hysteresis phenomenon. Due to the coupling effect among multiple quantum dots, the I-V and C-V curves measured of the photoelectric device shows the capacitance changes with the light intensity. We analyze the relationships between charge and discharge states of the hysteresis curves further. When a dumping readout designed and applied, it shows a response enhanced and the sensitivity detected to push more weak light level. It indicates the photoelectric device would be a promising candidate both in quantum information applications and highly sensitive imaging applications operating.

Original languageEnglish
Title of host publication2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages40-43
Number of pages4
ISBN (Electronic)9781467366953
DOIs
StatePublished - 1 Jul 2015
Event10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015 - Xi'an, China
Duration: 7 Apr 201511 Apr 2015

Publication series

Name2015 IEEE 10th International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015

Conference

Conference10th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2015
Country/TerritoryChina
CityXi'an
Period7/04/1511/04/15

Keywords

  • charge storage and discharge
  • dumping
  • electron transfer
  • hysteresis
  • quantum dots and quantum well hybrid structure

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