TY - JOUR
T1 - The adequacy of different landscape metrics for various landscape patterns
AU - Li, Xiuzhen
AU - He, Hong S.
AU - Bu, Rencang
AU - Wen, Qingchun
AU - Chang, Yu
AU - Hu, Yuanman
AU - Li, Yuehui
PY - 2005/12
Y1 - 2005/12
N2 - The behavior of several landscape pattern metrics were tested against various pattern scenarios generated by neutral landscape models, including number of classes, scale-map extent, scale-resolution, class proportion, aggregation level - RULE, and aggregation level - SimMap. The results demonstrate that most of the metrics are sensitive to certain pattern scenarios, yet are not sensitive to others; therefore, none of them is appropriate for all aspects of a landscape pattern. Despite these limitations, some of these metrics are recommended for future use, which include total number of patches, average patch size, total edge density, double-logged fractal, contagion, and aggregation index. Special attention should be paid to the relationships between metric values and ecological processes rather than the numbers themselves.
AB - The behavior of several landscape pattern metrics were tested against various pattern scenarios generated by neutral landscape models, including number of classes, scale-map extent, scale-resolution, class proportion, aggregation level - RULE, and aggregation level - SimMap. The results demonstrate that most of the metrics are sensitive to certain pattern scenarios, yet are not sensitive to others; therefore, none of them is appropriate for all aspects of a landscape pattern. Despite these limitations, some of these metrics are recommended for future use, which include total number of patches, average patch size, total edge density, double-logged fractal, contagion, and aggregation index. Special attention should be paid to the relationships between metric values and ecological processes rather than the numbers themselves.
KW - Behavior
KW - Landscape pattern
KW - Neutral model
KW - Pattern metrics (indices)
UR - https://www.scopus.com/pages/publications/25144469000
U2 - 10.1016/j.patcog.2005.05.009
DO - 10.1016/j.patcog.2005.05.009
M3 - 文章
AN - SCOPUS:25144469000
SN - 0031-3203
VL - 38
SP - 2626
EP - 2638
JO - Pattern Recognition
JF - Pattern Recognition
IS - 12
ER -