Abstract
Multispectral photodetectors (PDs) enable simultaneous photon detection across distinct bands, unlocking advanced capabilities such as precision object identification, autonomous navigation, and secure optical communication through spectral-specific signal discrimination. However, the integration of multiple spectral detection functionalities into a single device architecture remains a challenge. Here, a two-terminal, vertically stacked dual-heterostructure (DH) photodetector composed of a Te0.75Se0.25/Si/AZO (P-N-N+) configuration that achieves broadband spectral detection (300–1750 nm) under zero-bias operation while exhibiting a tunable bipolar photoresponse is presented. The device demonstrates high-performance metrics, including a specific detectivity exceeding 1011 Jones, a −3 dB cutoff frequency of 280 kHz, and an ultrafast response time of 726 ns under 1550 nm illumination. The selective detection of visible (VIS) and short-wave infrared (SWIR) spectra is effectively adjusted by varying the applied bias voltage. Capitalizing on these rapid response and bipolar characteristics, this PD facilitates pixel-level imaging and secure optical communication with encryption capability. Furthermore, a scanning imaging system that operates without the removal of an infrared cut-filter, achieving high-quality image recognition with a grayscale resolution beyond a 9-level grayscale is demonstrated. This work provides a promising strategy for developing bias-switchable, multimodal photodetectors with diverse applications in advanced imaging and communication technologies.
| Original language | English |
|---|---|
| Article number | e01126 |
| Journal | Laser and Photonics Reviews |
| Volume | 20 |
| Issue number | 2 |
| DOIs | |
| State | Published - 22 Jan 2026 |
Keywords
- TeSe
- bipolar bias operation
- multispectral photodetector
- spectral adaptation
- vertically stacked architecture
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