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Study on transport properties of two-dimensional electron gases in n-Hg0.80Mg0.20Te interface accumulation layer

  • Chun Ping Jiang*
  • , Yong Sheng Gui
  • , Guo Zhen Zheng
  • , Zhi Xun Ma
  • , Biao Li
  • , Shao Ling Guo
  • , Jun Hao Chu
  • *Corresponding author for this work
  • CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journalArticlepeer-review

Abstract

The transport properties in Hg0.80Mg0.20Te molecular beam epitaxy film has been studied in the temperature range from 1.5 to 250 K by variable magnetic-field Hall measurement. The experimental data have been analyzed using a hybrid approach consisting of the mobility spectrum (MS) technique followed by a multicarrier fitting (MCF) procedure. Both Shubnikov de Hass(SdH) Measurements and the hybrid approach show two-and three-dimensional electronic behaviors. Experimental results indicate that the two-dimensional electrons are due to an accumulation layer near the Hg1-xMgxTe-CdTe interface or the Hg1-xMgxTe-vacuum interface. Ionized impurity scattering of the three-dimension electron mobility dominates at low temperature (considering the screening effect) while lattice scattering dominates above 100 K. The scattering mechanism in Hg1-xMgxTe is very similar to that in Hg1-xCdxTe.

Original languageEnglish
Pages (from-to)1808
Number of pages1
JournalWuli Xuebao/Acta Physica Sinica
Volume49
Issue number9
StatePublished - Sep 2000
Externally publishedYes

Keywords

  • Variable magnetic-field Hall measurement accumulation layer two-dimensional electronic gas HgMgTe

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