Abstract
The transport properties in Hg0.80Mg0.20Te molecular beam epitaxy film has been studied in the temperature range from 1.5 to 250 K by variable magnetic-field Hall measurement. The experimental data have been analyzed using a hybrid approach consisting of the mobility spectrum (MS) technique followed by a multicarrier fitting (MCF) procedure. Both Shubnikov de Hass(SdH) Measurements and the hybrid approach show two-and three-dimensional electronic behaviors. Experimental results indicate that the two-dimensional electrons are due to an accumulation layer near the Hg1-xMgxTe-CdTe interface or the Hg1-xMgxTe-vacuum interface. Ionized impurity scattering of the three-dimension electron mobility dominates at low temperature (considering the screening effect) while lattice scattering dominates above 100 K. The scattering mechanism in Hg1-xMgxTe is very similar to that in Hg1-xCdxTe.
| Original language | English |
|---|---|
| Pages (from-to) | 1808 |
| Number of pages | 1 |
| Journal | Wuli Xuebao/Acta Physica Sinica |
| Volume | 49 |
| Issue number | 9 |
| State | Published - Sep 2000 |
| Externally published | Yes |
Keywords
- Variable magnetic-field Hall measurement accumulation layer two-dimensional electronic gas HgMgTe