Abstract
By using quantitative mobility spectrum analysis technique, the temperature-dependent density and mobility for each subband of the accumulated layer on the n-HgCdTe devices have been determined from magnetic-field-dependent Hall and resistivity data. The results agree well with the Shubnikov-de Hass measurements and theoretical calculations.
| Original language | English |
|---|---|
| Pages (from-to) | 1359-1360 |
| Number of pages | 2 |
| Journal | Wuli Xuebao/Acta Physica Sinica |
| Volume | 47 |
| Issue number | 8 |
| State | Published - 1998 |