Study on the composition profile of a Hg1-xCdxTe epitaxy film by infrared transmission spectroscopy

Biao Li; Junhao Chu; Kun Liu; Dingyuan Tang

doi:10.1088/0953-8984/7/1/004

Study on the composition profile of a Hg_1-xCd_xTe epitaxy film by infrared transmission spectroscopy

Biao Li^*
, Junhao Chu
, Kun Liu
, Dingyuan Tang

^*Corresponding author for this work

Chinese Academy of Sciences

Research output: Contribution to journal › Article › peer-review

15 Scopus citations

Abstract

Based on our empirical rules for the intrinsic absorption coefficient and refractive index of Hg_1-xCd_xTe in Hougen's model, a useful method for determining the composition profile of an epitaxy layer from room-temperature infrared transmittance spectroscopy is presented. The compositional depth non-uniformity of Hg_1-xCd_xTe film samples grown by liquid-phase epitaxy, metal-organic chemical vapour deposition and molecular beam epitaxy techniques is determined using this method and compared with that from secondary ion mass spectroscopy and X-ray microprobic measurements.

Original language	English
Article number	004
Pages (from-to)	29-35
Number of pages	7
Journal	Journal of Physics Condensed Matter
Volume	7
Issue number	1
DOIs	https://doi.org/10.1088/0953-8984/7/1/004
State	Published - 1995
Externally published	Yes

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@article{ead6a5f802074586bf37f858106ca2bf,

title = "Study on the composition profile of a Hg1-xCdxTe epitaxy film by infrared transmission spectroscopy",

abstract = "Based on our empirical rules for the intrinsic absorption coefficient and refractive index of Hg1-xCdxTe in Hougen's model, a useful method for determining the composition profile of an epitaxy layer from room-temperature infrared transmittance spectroscopy is presented. The compositional depth non-uniformity of Hg1-xCdxTe film samples grown by liquid-phase epitaxy, metal-organic chemical vapour deposition and molecular beam epitaxy techniques is determined using this method and compared with that from secondary ion mass spectroscopy and X-ray microprobic measurements.",

author = "Biao Li and Junhao Chu and Kun Liu and Dingyuan Tang",

year = "1995",

doi = "10.1088/0953-8984/7/1/004",

language = "英语",

volume = "7",

pages = "29--35",

journal = "Journal of Physics Condensed Matter",

issn = "0953-8984",

publisher = "IOP Publishing Ltd.",

number = "1",

}

TY - JOUR

T1 - Study on the composition profile of a Hg1-xCdxTe epitaxy film by infrared transmission spectroscopy

AU - Li, Biao

AU - Chu, Junhao

AU - Liu, Kun

AU - Tang, Dingyuan

PY - 1995

Y1 - 1995

N2 - Based on our empirical rules for the intrinsic absorption coefficient and refractive index of Hg1-xCdxTe in Hougen's model, a useful method for determining the composition profile of an epitaxy layer from room-temperature infrared transmittance spectroscopy is presented. The compositional depth non-uniformity of Hg1-xCdxTe film samples grown by liquid-phase epitaxy, metal-organic chemical vapour deposition and molecular beam epitaxy techniques is determined using this method and compared with that from secondary ion mass spectroscopy and X-ray microprobic measurements.

AB - Based on our empirical rules for the intrinsic absorption coefficient and refractive index of Hg1-xCdxTe in Hougen's model, a useful method for determining the composition profile of an epitaxy layer from room-temperature infrared transmittance spectroscopy is presented. The compositional depth non-uniformity of Hg1-xCdxTe film samples grown by liquid-phase epitaxy, metal-organic chemical vapour deposition and molecular beam epitaxy techniques is determined using this method and compared with that from secondary ion mass spectroscopy and X-ray microprobic measurements.

UR - https://www.scopus.com/pages/publications/0013236273

U2 - 10.1088/0953-8984/7/1/004

DO - 10.1088/0953-8984/7/1/004

M3 - 文章

AN - SCOPUS:0013236273

SN - 0953-8984

VL - 7

SP - 29

EP - 35

JO - Journal of Physics Condensed Matter

JF - Journal of Physics Condensed Matter

IS - 1

M1 - 004

ER -

Study on the composition profile of a Hg_1-xCd_xTe epitaxy film by infrared transmission spectroscopy

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