Abstract
Zn inclusions/precipitates in Bridgman-grown CdZnTe crystals, for the first time, have been characterized by scanning electron microscopy with an electron probe X-ray microanalyzer (SEM/EPMA). The Zn inclusions/precipitates in CdZnTe crystals are possibly due to Zn segregation effects resulting from the deviation from the congruent melting point. It is also shown that Te-and Cd-rich regions surrounding the Zn inclusions/precipitates edge, due to the non-stoichiometric solid compositions, lead to the formation of Te and/or Cd precipitates around the Zn inclusions/precipitates. The infrared transmittance of these stoichiometric-type CdZnTe is about 64% in the wavenumber range of 400-4000 cm-1.
| Original language | English |
|---|---|
| Pages (from-to) | 357-360 |
| Number of pages | 4 |
| Journal | Journal of Crystal Growth |
| Volume | 171 |
| Issue number | 3-4 |
| DOIs | |
| State | Published - Feb 1997 |
| Externally published | Yes |