TY - JOUR
T1 - Structure, optical and magnetic properties of Bi 1-x Eu x FeO 3 films fabricated by pulsed laser deposition
AU - Liu, Jian
AU - Deng, Hongmei
AU - Zhu, Liping
AU - Zhang, Kezhi
AU - Meng, Xiankuan
AU - Cao, Huiyi
AU - Yang, Pingxiong
AU - Chu, Junhao
N1 - Publisher Copyright:
© 2014 Elsevier B.V. All rights reserved.
PY - 2014
Y1 - 2014
N2 - Multiferroic Bi 1-x Eu x FeO 3 (BEFO x , x = 0, 0.03, 0.05, 0.07, 0.10) films were grown on (1 00) SrTiO 3 substrates by pulsed laser deposition. X-ray diffraction analysis indicates the strong (h00) peaks, and no impurity phases are observed. Atomic force microscopy shows the root mean square roughness of the films is less than 0.87 nm, which indicates the BEFOx films are smooth and uniform. Transmittance spectra demonstrate that the optical band gap of the BEFOx films decreases with increasing Eu content. The saturation magnetization M s of the BEFO x films is significantly enhanced with increasing Eu content, which provides potential applications in magnetoelectric memory devices and data storage media.
AB - Multiferroic Bi 1-x Eu x FeO 3 (BEFO x , x = 0, 0.03, 0.05, 0.07, 0.10) films were grown on (1 00) SrTiO 3 substrates by pulsed laser deposition. X-ray diffraction analysis indicates the strong (h00) peaks, and no impurity phases are observed. Atomic force microscopy shows the root mean square roughness of the films is less than 0.87 nm, which indicates the BEFOx films are smooth and uniform. Transmittance spectra demonstrate that the optical band gap of the BEFOx films decreases with increasing Eu content. The saturation magnetization M s of the BEFO x films is significantly enhanced with increasing Eu content, which provides potential applications in magnetoelectric memory devices and data storage media.
KW - Eu-doped BiFeO
KW - Optical and magnetic properties
KW - Pulsed laser deposition
KW - Thin films
UR - https://www.scopus.com/pages/publications/84922506036
U2 - 10.1016/j.apsusc.2014.07.179
DO - 10.1016/j.apsusc.2014.07.179
M3 - 文章
AN - SCOPUS:84922506036
SN - 0169-4332
VL - 316
SP - 78
EP - 81
JO - Applied Surface Science
JF - Applied Surface Science
IS - 1
ER -