Structure and optical properties of BiFe 1 - XZn xO 3 thin films fabricated by pulsed laser deposition

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Abstract

Multiferroic BiFe 1 - xZn xO 3 (0 ≤ x ≤ 0.10) thin films were prepared on LaNiO 3 coating Si substrates by pulsed laser deposition. X-ray diffraction data confirmed the substitutions of Zn into the Fe site. The films are the dominant orientation of (101). Three A 1 and five E modes are observed in Raman spectra. With increasing x, the position of the Raman active modes shift to higher wavenumber, and the full width at half maximum becomes smaller. At the photon energy of 2 eV, the refractive index is 2.71, and the extinction coefficient is close to zero. The band gap increases with the Zn amount, which may be caused by Burstein-Moss effect.

Original languageEnglish
Pages (from-to)71-73
Number of pages3
JournalMaterials Letters
Volume82
DOIs
StatePublished - 1 Sep 2012

Keywords

  • BiFeO
  • Ferroelectrics
  • Optical properties
  • Thin films

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