Structural and optical properties of PbZr0.5Ti0.5O3/La0.5Sr0.5CoO3 multilayer thin films prepared by chemical solution routes

La_0.5Sr_0.5CoO₃ (LSCO) thin films were deposited on Si substrate by metalorganic chemical liquid deposition (MOCLD). PbZr_0.5Ti_0.5O₃ (PZT) were deposited on LSCO thin films by sol-gel process. X-ray diffraction investigation shows that PZT/LSCO multilayer thin films are polycrystalline with preperential (110) -orientation and contain perovskite phase only. The grain diameter of PZT was estimated to be about 50-80 nm by Scherrer's equation. Atomic force microscopy measurement shows that the films have smooth surface with RMS<5 nm. Raman spectrum was used to study the structural property of PZT/LSCO thin films. The optical properties of the films were measured by spectroscopic ellipsometry in the wavelength range of 400-1700 nm. Lorentz model was used to express the optical properties of PZT and LSCO thin films. Optical constants (refractive index n and extinction coefficient k) of the PZT and LSCO films were obtained.