Structural and optical properties of Bi3.25Nd 0.75Ti3O12 ferroelectric thin films

J. H. Ma; X. J. Meng; J. L. Sun; J. Q. Xue; Z. G. Hu; F. W. Shi; T. Lin; J. H. Chu

doi:10.1007/s00339-007-4014-9

Structural and optical properties of Bi_3.25Nd _0.75Ti₃O₁₂ ferroelectric thin films

J. H. Ma^*
, X. J. Meng
, J. L. Sun
, J. Q. Xue
, Z. G. Hu
, F. W. Shi
, T. Lin
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

Abstract

Ferroelectric Bi_3.25Nd_0.75Ti₃O ₁₂ (BNT) thin films were grown on (111)Pt/Ti/SiO₂/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2-1.7 μm and 2.5-11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.

Original language	English
Pages (from-to)	439-442
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	88
Issue number	2
DOIs	https://doi.org/10.1007/s00339-007-4014-9
State	Published - Aug 2007
Externally published	Yes

Access to Document

10.1007/s00339-007-4014-9

Cite this

@article{96d0d993351b4e67a724a29e89a54c75,

title = "Structural and optical properties of Bi3.25Nd 0.75Ti3O12 ferroelectric thin films",

abstract = "Ferroelectric Bi3.25Nd0.75Ti3O 12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2-1.7 μm and 2.5-11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.",

author = "Ma, \{J. H.\} and Meng, \{X. J.\} and Sun, \{J. L.\} and Xue, \{J. Q.\} and Hu, \{Z. G.\} and Shi, \{F. W.\} and T. Lin and Chu, \{J. H.\}",

year = "2007",

month = aug,

doi = "10.1007/s00339-007-4014-9",

language = "英语",

volume = "88",

pages = "439--442",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

publisher = "Springer Heidelberg",

number = "2",

}

TY - JOUR

T1 - Structural and optical properties of Bi3.25Nd 0.75Ti3O12 ferroelectric thin films

AU - Ma, J. H.

AU - Meng, X. J.

AU - Sun, J. L.

AU - Xue, J. Q.

AU - Hu, Z. G.

AU - Shi, F. W.

AU - Lin, T.

AU - Chu, J. H.

PY - 2007/8

Y1 - 2007/8

N2 - Ferroelectric Bi3.25Nd0.75Ti3O 12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2-1.7 μm and 2.5-11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.

AB - Ferroelectric Bi3.25Nd0.75Ti3O 12 (BNT) thin films were grown on (111)Pt/Ti/SiO2/Si substrates by a chemical solution method. The films were composed of large rod-like grains. XRD and Raman spectroscopy measurements showed they were polycrystalline perovskite structure with a good crystallinity. Pt/BNT/Pt capacitors had been fabricated and showed good ferroelectricity. The optical constants (n, k) of BNT thin films in the wavelength ranges of 0.2-1.7 μm and 2.5-11.4 μm were obtained by spectroscopic ellipsometry measurements. The dispersion of the refractive index in the interband transition region followed the single electronic oscillator model. The optical band gap was found to be about 3.61 eV.

UR - https://www.scopus.com/pages/publications/34250631006

U2 - 10.1007/s00339-007-4014-9

DO - 10.1007/s00339-007-4014-9

M3 - 文章

AN - SCOPUS:34250631006

SN - 0947-8396

VL - 88

SP - 439

EP - 442

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 2

ER -

Structural and optical properties of Bi_3.25Nd _0.75Ti₃O₁₂ ferroelectric thin films

Abstract

Access to Document

Other files and links

Fingerprint

Cite this