Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution methods

G. S. Wang; X. J. Meng; Z. Q. Lai; J. Yu; J. L. Sun; S. L. Guo; J. H. Chu

doi:10.1007/s003390201305

Structural and optical properties of Bi_3.25La_0.75Ti₃O₁₂ ferroelectric thin films prepared by chemical solution methods

G. S. Wang^*
, X. J. Meng
, Z. Q. Lai
, J. Yu
, J. L. Sun
, S. L. Guo
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

Ferroelectric Bi_3.25La_0.75Ti₃O₁₂ (BLT) thin films have been grown on Pt/Ti/SiO₂/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm² and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 10⁹ switching cycles. The optical constants (n, k) of the BLT thin films in the wavelength range 0.35-1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.

Original language	English
Pages (from-to)	83-86
Number of pages	4
Journal	Applied Physics A: Materials Science and Processing
Volume	76
Issue number	1
DOIs	https://doi.org/10.1007/s003390201305
State	Published - Jan 2003
Externally published	Yes

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title = "Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution methods",

abstract = "Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films have been grown on Pt/Ti/SiO2/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm2 and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 109 switching cycles. The optical constants (n, k) of the BLT thin films in the wavelength range 0.35-1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.",

author = "Wang, \{G. S.\} and Meng, \{X. J.\} and Lai, \{Z. Q.\} and J. Yu and Sun, \{J. L.\} and Guo, \{S. L.\} and Chu, \{J. H.\}",

year = "2003",

month = jan,

doi = "10.1007/s003390201305",

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volume = "76",

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journal = "Applied Physics A: Materials Science and Processing",

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T1 - Structural and optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films prepared by chemical solution methods

AU - Wang, G. S.

AU - Meng, X. J.

AU - Lai, Z. Q.

AU - Yu, J.

AU - Sun, J. L.

AU - Guo, S. L.

AU - Chu, J. H.

PY - 2003/1

Y1 - 2003/1

N2 - Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films have been grown on Pt/Ti/SiO2/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm2 and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 109 switching cycles. The optical constants (n, k) of the BLT thin films in the wavelength range 0.35-1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.

AB - Ferroelectric Bi3.25La0.75Ti3O12 (BLT) thin films have been grown on Pt/Ti/SiO2/Si substrates by chemical solution methods. X-ray diffraction analysis shows that BLT thin films are polycrystalline with (171)-preferential orientation. Atomic force microscopy investigation shows that they have large grains about 120 nm in size. A Pt/BLT/Pt capacitor has been fabricated and showed excellent ferroelectricity, with a remnant polarization and coercive field of 24 μC/cm2 and 116 kV/cm, respectively. The capacitor shows no polarization fatigue up to 109 switching cycles. The optical constants (n, k) of the BLT thin films in the wavelength range 0.35-1.7 μm were obtained by spectroscopic ellipsometry measurements, and the band-gap energy was found to be about 3.25 eV.

UR - https://www.scopus.com/pages/publications/0037227308

U2 - 10.1007/s003390201305

DO - 10.1007/s003390201305

M3 - 文章

AN - SCOPUS:0037227308

SN - 0947-8396

VL - 76

SP - 83

EP - 86

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

IS - 1

ER -

Structural and optical properties of Bi_3.25La_0.75Ti₃O₁₂ ferroelectric thin films prepared by chemical solution methods

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