Structural and electrical properties of Mn1.56Co 0.96Ni0.48O4 NTC thermistor films

Y. Q. Gao; Z. M. Huang; Y. Hou; J. Wu; W. Zhou; C. Ouyang; J. G. Huang; J. C. Tong; J. H. Chu

doi:10.1016/j.mseb.2014.02.011

Structural and electrical properties of Mn_1.56Co _0.96Ni_0.48O₄ NTC thermistor films

Y. Q. Gao^*
, Z. M. Huang
, Y. Hou
, J. Wu
, W. Zhou
, C. Ouyang
, J. G. Huang
, J. C. Tong
, J. H. Chu

^*Corresponding author for this work

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

High quality Mn_1.56Co_0.96Ni_0.48O ₄ (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant a_cal is slightly smaller compared with the XRD experiment results a_film. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.

Original language	English
Pages (from-to)	74-78
Number of pages	5
Journal	Materials Science and Engineering: B
Volume	185
Issue number	1
DOIs	https://doi.org/10.1016/j.mseb.2014.02.011
State	Published - Jul 2014
Externally published	Yes

Keywords

Sensitivity and stability
Structural and electrical properties
Thermal sensors

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10.1016/j.mseb.2014.02.011

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title = "Structural and electrical properties of Mn1.56Co 0.96Ni0.48O4 NTC thermistor films",

abstract = "High quality Mn1.56Co0.96Ni0.48O 4 (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant acal is slightly smaller compared with the XRD experiment results afilm. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.",

keywords = "Sensitivity and stability, Structural and electrical properties, Thermal sensors",

author = "Gao, \{Y. Q.\} and Huang, \{Z. M.\} and Y. Hou and J. Wu and W. Zhou and C. Ouyang and Huang, \{J. G.\} and Tong, \{J. C.\} and Chu, \{J. H.\}",

year = "2014",

month = jul,

doi = "10.1016/j.mseb.2014.02.011",

language = "英语",

volume = "185",

pages = "74--78",

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TY - JOUR

T1 - Structural and electrical properties of Mn1.56Co 0.96Ni0.48O4 NTC thermistor films

AU - Gao, Y. Q.

AU - Huang, Z. M.

AU - Hou, Y.

AU - Wu, J.

AU - Zhou, W.

AU - Ouyang, C.

AU - Huang, J. G.

AU - Tong, J. C.

AU - Chu, J. H.

PY - 2014/7

Y1 - 2014/7

N2 - High quality Mn1.56Co0.96Ni0.48O 4 (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant acal is slightly smaller compared with the XRD experiment results afilm. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.

AB - High quality Mn1.56Co0.96Ni0.48O 4 (MCN) films have been prepared by chemical solution deposition method. The microstructure and electrical properties of the films are investigated with different layers. Both the crystalline quality and the grain size improve when the film layers increase. The theoretical lattice constant acal is slightly smaller compared with the XRD experiment results afilm. The temperature dependence of resistivity can be described by a variable range hopping model for a parabolic density of states. With the increase of film layers, the sensitivity and stability of the MCN films increase. The advantage of good negative temperature coefficient thermistor characteristic makes the MCN films very preponderant for thermal sensors.

KW - Sensitivity and stability

KW - Structural and electrical properties

KW - Thermal sensors

UR - https://www.scopus.com/pages/publications/84896514989

U2 - 10.1016/j.mseb.2014.02.011

DO - 10.1016/j.mseb.2014.02.011

M3 - 文章

AN - SCOPUS:84896514989

SN - 0921-5107

VL - 185

SP - 74

EP - 78

JO - Materials Science and Engineering: B

JF - Materials Science and Engineering: B

IS - 1

ER -

Structural and electrical properties of Mn_1.56Co _0.96Ni_0.48O₄ NTC thermistor films

Abstract

Keywords

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