Spectroscopic and electrical investigation of Fe doped Hg1-xCdxTe

  • Yong Chang*
  • , Junhao Chu
  • , Wenguo Tang
  • , Wenzhong Shen
  • , Dingyuan Tang
  • , Runqing Ye
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

The investigation on Fe doped Hg1-xCdxTe samples has been performed by infrared transmission spectroscopy, photoluminescence spectroscopy and Hall measurements. The Fe impurity behavior doped in Hg1-xCdxTe has been studied, a donor level which is about 80meV below the bottom of the conduction band was discovered. Exhibiting no electrical activity, the Fe doped in Hg1-xCdxTe can influence the non-equilibrium carrier lifetime by acting as the non-radiative combination center, which can be discovered through the temperature dependence of integrated photoluminescence intensity.

Original languageEnglish
Pages (from-to)258-263
Number of pages6
JournalPan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors
Volume18
Issue number4
StatePublished - Apr 1997
Externally publishedYes

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