Source-Free Domain Adaptation of Weakly-Supervised Object Localization Models for Histology

  • Alexis Guichemerre*
  • , Soufiane Belharbi
  • , Tsiry Mayet
  • , Shakeeb Murtaza
  • , Pourya Shamsolmoali
  • , Luke McCaffrey
  • , Eric Granger
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Scopus citations

Abstract

Given the emergence of deep learning, digital pathology has gained popularity for cancer diagnosis based on histology images. Deep weakly supervised object localization (WSOL) models can be trained to classify histology images according to cancer grade and identify regions of interest (ROIs) for interpretation, using inexpensive global image-class annotations. A WSOL model initially trained on some labeled source image data can be adapted using unlabeled target data in cases of significant domain shifts caused by variations in staining, scanners, and cancer type. In this paper, we focus on source-free (unsupervised) domain adaptation (SFDA), a challenging problem where a pre-trained source model is adapted to a new target domain without using any source domain data for privacy and efficiency reasons. SFDA of WSOL models raises several challenges in histology, most notably because they are not intended to adapt for both classification and localization tasks. In this paper, 4 state-of-the-art SFDA methods, each one representative of a main SFDA family, are compared for WSOL in terms of classification and localization accuracy. They are the SFDA-Distribution Estimation, Source HypOthesis Transfer, Cross-Domain Contrastive Learning, and Adaptively Domain Statistics Alignment. Experimental results on the challenging Glas (smaller, breast cancer) and Came-lyon16 (larger, colon cancer) histology datasets indicate that these SFDA methods typically perform poorly for localization after adaptation when optimized for classification. Code: github.com/AlexisGuichemerreCode/survey-hist-wsol-sfda

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
PublisherIEEE Computer Society
Pages33-43
Number of pages11
ISBN (Electronic)9798350365474
DOIs
StatePublished - 2024
Externally publishedYes
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

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