Abstract
In this work, we propose and demonstrate a durable and distributable Lambertian light-emitter secondary standard using the electroluminescence (EL) of a Si solar cell. This standard is useful for calibration of the absolute sensitivity of an EL-imaging infrared camera used to acquire quick on-site measurements of the absolute EL efficiencies of individual Si solar cells in modules and arrays. The developed method enables the realization of quantitative open-circuit voltage mapping.
| Original language | English |
|---|---|
| Article number | 034501 |
| Journal | Journal of Applied Physics |
| Volume | 119 |
| Issue number | 3 |
| DOIs | |
| State | Published - 21 Jan 2016 |