TY - GEN
T1 - Software Enabled wear-leveling for hybrid PCM main memory on embedded systems
AU - Hu, Jingtong
AU - Zhuge, Qingfeng
AU - Xue, Chun Jason
AU - Tseng, Wei Che
AU - Sha, Edwin H.M.
PY - 2013
Y1 - 2013
N2 - Phase Change Memory (PCM) is a promising DRAM replacement in embedded systems due to its attractive characteristics. However, relatively low endurance has limited its practical applications. In this paper, in additional to existing hardware level optimizations, we propose software enabled wear-leveling techniques to further extend PCM's lifetime when it is adopted in embedded systems. A polynomial-time algorithm, the Software Wear-Leveling (SWL) algorithm, is proposed in this paper to achieve wear-leveling without hardware overhead. According to the experimental results, the proposed technique can reduce the number of writes on the most-written bits by more than 80% when compared with a greedy algorithm, and by around 60% when compared with the existing Optimal Data Allocation (ODA) algorithm with under 6% memory access overhead.
AB - Phase Change Memory (PCM) is a promising DRAM replacement in embedded systems due to its attractive characteristics. However, relatively low endurance has limited its practical applications. In this paper, in additional to existing hardware level optimizations, we propose software enabled wear-leveling techniques to further extend PCM's lifetime when it is adopted in embedded systems. A polynomial-time algorithm, the Software Wear-Leveling (SWL) algorithm, is proposed in this paper to achieve wear-leveling without hardware overhead. According to the experimental results, the proposed technique can reduce the number of writes on the most-written bits by more than 80% when compared with a greedy algorithm, and by around 60% when compared with the existing Optimal Data Allocation (ODA) algorithm with under 6% memory access overhead.
UR - https://www.scopus.com/pages/publications/84885576582
U2 - 10.7873/date.2013.131
DO - 10.7873/date.2013.131
M3 - 会议稿件
AN - SCOPUS:84885576582
SN - 9783981537000
T3 - Proceedings -Design, Automation and Test in Europe, DATE
SP - 599
EP - 602
BT - Proceedings - Design, Automation and Test in Europe, DATE 2013
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 16th Design, Automation and Test in Europe Conference and Exhibition, DATE 2013
Y2 - 18 March 2013 through 22 March 2013
ER -