Abstract
Achieving high mobility while minimizing off-current and static power consumption is critical for applications of two-dimensional field-effect transistors. Herein, a selenium (Se) sacrificial layer is introduced between the rhenium sulfide (ReS2) semiconductor and source/drain electrode. With the Se layer and postannealing process, the ReS2 transistor significantly decreases the off-state current with a substantial increase in the on-state current density. Notably, the mobility reaches 237 cm2 V-1 s-1, which is accompanied by an extraordinary current on/off ratio of 1011 at 7 K. The theoretical calculations and noise analysis show that the improvement in device performance is ascribed to the Se protective layer, which effectively shields the semiconductor from direct exposure to high-energy metal particles, reducing the Schottky barrier and the number of defect states at the interface. Finally, Se sacrificial ReS2 transistor-based versatile logic circuits including NAND and NOR logic are executed, which can be widely applied in integrated circuits.
| Original language | English |
|---|---|
| Pages (from-to) | 655-662 |
| Number of pages | 8 |
| Journal | Nano Letters |
| Volume | 25 |
| Issue number | 2 |
| DOIs | |
| State | Published - 15 Jan 2025 |
Keywords
- ReS transistors
- Se sacrificial layer
- high mobility
- logic circuits
- on/off ratio