Abstract
Scan-based design for test (DFT) is a powerful and the most popular testing technique. However, while scanbased DFT improves test efficiency, it also leaves a side channel to the privacy information stored in the chip. This paper investigates the side channel and proposes a simple but powerful scan-based attack that can reveal the key and/or state stored in the chips that implement the state-of-the-art stream ciphers with less than 85 scan-out vectors.
| Original language | English |
|---|---|
| Pages (from-to) | 646-655 |
| Number of pages | 10 |
| Journal | Journal of Computer Science and Technology |
| Volume | 29 |
| Issue number | 4 |
| DOIs | |
| State | Published - Jan 2014 |
| Externally published | Yes |
Keywords
- linear and non-linear feedback shift register
- scan-based attack
- scan-based design for test
- stream cipher