S3DA: A 3D Point Cloud Based PCB Solder Defect Detection Algorithm

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Surface Mount Technology (SMT) is prevalent in Printed Circuit Board (PCB) assembly, mainly using solder printing to connect the components and the board. During the process of solder printing, solder defects due to machine failure and environmental factors are widespread. Existing defect detection methods mainly use computer vision to detect solder defects. The main idea of this type of method is to obtain the image information and defect features of the PCB and use the machine learning model to identify the solder defects of the PCB. In actual industrial PCB assembly, the lack of illumination and the occlusion caused by other workpieces leads to incomplete input images for machine learning models, which makes existing methods unable to detect such occluded defects. In order to solve the above problems, this paper proposes a new algorithm for solder defect detection using 3D point cloud data. First, the point cloud data is obtained by scanning the 3D point cloud camera. Next, the point cloud data is denoised and filtered, and the area of interest is further screened to obtain the solder area to be calculated. Finally, using the idea based on integral summation, solder defects are identified by calculating the solder volume. This algorithm can automatically assist manual judgment and effectively identify possible defects in solder processing.

Original languageEnglish
Title of host publicationSoftware Fault Prevention, Verification, and Validation - 1st International Symposium, SFPVV 2024, Proceedings
EditorsShaoying Liu
PublisherSpringer Science and Business Media Deutschland GmbH
Pages115-130
Number of pages16
ISBN (Print)9789819616206
DOIs
StatePublished - 2025
Event1st International Symposium on Software Fault Prevention, Verification, and Validation, SFPVV 2024 - Hiroshima, Japan
Duration: 2 Dec 20243 Dec 2024

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume15393 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference1st International Symposium on Software Fault Prevention, Verification, and Validation, SFPVV 2024
Country/TerritoryJapan
CityHiroshima
Period2/12/243/12/24

Keywords

  • Automatic Optical Inspection (AOI)
  • Defect detection
  • Point cloud
  • Solder joint

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