RPMIL: Rethinking Uncertainty-Aware Probabilistic Multiple Instance Learning for Whole Slide Pathology Diagnosis

Zhikang Zhao, Kaitao Chen, Jing Zhao*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Whole slide images (WSIs) are gigapixel digital scans of traditional pathology slides, offering substantial support for cancer diagnosis. Current multiple instance learning (MIL) methods for WSIs typically extract instance features and aggregate these into a single bag feature for prediction. We observe that these MIL methods rely on point estimation, where each bag is mapped to a deterministic embedding. Such MIL methods based on point estimation fail to capture the full spectrum of data variability due to the reliance on fixed embedding, especially when the number of trainable bags is limited. In this paper, we rethink probabilistic modeling in MIL and propose RPMIL, an uncertainty-aware probabilistic MIL method for whole slide pathology diagnosis. RPMIL learns a probabilistic aggregator to consolidate instance features into dynamic bag feature distributions instead of a deterministic bag feature. Specifically, we employ a variational autoencoder approach to compress multiple instance features into a low-dimension space with probabilistic representation and obtain the bag feature distribution formulated by the mean and variance. Furthermore, we drive the prediction by jointly leveraging the instance feature distribution and bag feature distribution. We evaluate the WSI classification performance on two public datasets: Camelyon16 and TCGA-NSCLC. Extensive experiments demonstrate that our method surpasses point estimation methods in MIL, achieving state-of-the-art levels.

Original languageEnglish
Title of host publicationProceedings of the 34th International Joint Conference on Artificial Intelligence, IJCAI 2025
EditorsJames Kwok
PublisherInternational Joint Conferences on Artificial Intelligence
Pages2467-2475
Number of pages9
ISBN (Electronic)9781956792065
DOIs
StatePublished - 2025
Event34th Internationa Joint Conference on Artificial Intelligence, IJCAI 2025 - Montreal, Canada
Duration: 16 Aug 202522 Aug 2025

Publication series

NameIJCAI International Joint Conference on Artificial Intelligence
ISSN (Print)1045-0823

Conference

Conference34th Internationa Joint Conference on Artificial Intelligence, IJCAI 2025
Country/TerritoryCanada
CityMontreal
Period16/08/2522/08/25

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