Abstract
Mn-doped Ga2 O3 (7 cation % of Mn) thin film has been grown on c -cut sapphire substrate using pulsed-laser deposition technique. Electron diffraction analyses by transmission electron microscopy found that the Mn-doped film shows γ phase with spinel structure, which is different from undoped film showing Β phase. No secondary phase can be detected. Combination of Mn- L2,3 near edge x-ray absorption experiments with first-principles many-electron calculations unambiguously implies that Mn atoms are located at tetrahedrally coordinated Ga sites with a valence of +2. The doped sample shows ferromagnetism up to 350 K.
| Original language | English |
|---|---|
| Article number | 181903 |
| Journal | Applied Physics Letters |
| Volume | 89 |
| Issue number | 18 |
| DOIs | |
| State | Published - 2006 |
| Externally published | Yes |