TY - GEN
T1 - Revealing Sub-Cell Degradation of Multi-Junction Solar Cells by Absolute Electroluminescence Imaging
AU - Wang, Youyang
AU - Li, Liying
AU - Hu, Xiaobo
AU - Jia, Yun
AU - Weng, Guoen
AU - Luo, Xianjia
AU - Chen, Shaoqiang
AU - Akiyama, Hidefumi
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
N2 - Photovoltaic solar cells degrade or even fail during long-term storage, affecting their conversion efficiency and lifetime. In this work, an industry-standard InGaP/GaAs/InGaAs multi-junction solar cell (MJSC) was monitoredin a non-working idle state for more than two years. The sub-cell degradation caused by prolonged storage and its origin have been revealed by using the absolute electroluminescence (EL) imaging technique. Several potential defects were found to gradually exacerbate over time, introducing more non-radiative recombination centers and reducing the sub-cell external radiative efficiency under low-injection conditions. Quantitative evaluation results show that long-term idle resultedin an over 0.2% efficiency degradation and an over 1% fill factor degradation for each sub-cell, which is mainly originated from the non-radiative recombination loss.
AB - Photovoltaic solar cells degrade or even fail during long-term storage, affecting their conversion efficiency and lifetime. In this work, an industry-standard InGaP/GaAs/InGaAs multi-junction solar cell (MJSC) was monitoredin a non-working idle state for more than two years. The sub-cell degradation caused by prolonged storage and its origin have been revealed by using the absolute electroluminescence (EL) imaging technique. Several potential defects were found to gradually exacerbate over time, introducing more non-radiative recombination centers and reducing the sub-cell external radiative efficiency under low-injection conditions. Quantitative evaluation results show that long-term idle resultedin an over 0.2% efficiency degradation and an over 1% fill factor degradation for each sub-cell, which is mainly originated from the non-radiative recombination loss.
KW - III-V compound semiconductor
KW - absolute EL imaging
KW - multi-junction solar cells
KW - sub-cell degradation
UR - https://www.scopus.com/pages/publications/85142814851
U2 - 10.1109/PVSC48317.2022.9938663
DO - 10.1109/PVSC48317.2022.9938663
M3 - 会议稿件
AN - SCOPUS:85142814851
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 468
EP - 471
BT - 2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Y2 - 5 June 2022 through 10 June 2022
ER -
