Refractive index enhancement effect in Hg1-xCdxTe near the fundamental GAP

  • Z. M. Huang*
  • , Z. H. Zhang
  • , C. P. Jiang
  • , J. H. Chu
  • *Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

The refractive indices of Hg1-xCdxTe bulk samples with the composition x=0.276, 0.309, and 0.378 were measured by infrared spectroscopic ellipsometry at room temperature in the energy regions which were below, across, and above the fundamental band gap. An obvious refractive index enhancement effect was observed in the refractive index spectra for each composition. The energy position of the maximal refractive index value approximately equals to that of the band gap. The refractive index versus wavelength λ above the band gap for x between x=0.279 and 0.378 was modeled with Sellmeier dispersion relationship: n2(λ)=a1+a22+a34+a46.

Original languageEnglish
Pages (from-to)161-164
Number of pages4
JournalHongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves
Volume20
Issue number3
StatePublished - Jun 2001
Externally publishedYes

Keywords

  • HgCdTe
  • Infrared spectroscopic ellipsometry
  • Refractive index

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