Refractive index and absorption of an indium phthalocyanine thin film

Xiaodong Tang; Qiyang Chen; Donghong Gu; Fuxi Gan

Refractive index and absorption of an indium phthalocyanine thin film

Xiaodong Tang^*
, Qiyang Chen
, Donghong Gu
, Fuxi Gan

^*Corresponding author for this work

CAS - Shanghai Institute of Optics and Fine Mechanics

Research output: Contribution to journal › Article › peer-review

Abstract

A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

Original language	English
Pages (from-to)	925-929
Number of pages	5
Journal	Zhongguo Jiguang/Chinese Journal of Lasers
Volume	22
Issue number	12
State	Published - Dec 1995
Externally published	Yes

Cite this

@article{2638fd362ed94bf9940f24afe107140b,

title = "Refractive index and absorption of an indium phthalocyanine thin film",

abstract = "A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.",

author = "Xiaodong Tang and Qiyang Chen and Donghong Gu and Fuxi Gan",

year = "1995",

month = dec,

language = "英语",

volume = "22",

pages = "925--929",

journal = "Zhongguo Jiguang/Chinese Journal of Lasers",

issn = "0258-7025",

publisher = "Chinese Laser Press",

number = "12",

}

TY - JOUR

T1 - Refractive index and absorption of an indium phthalocyanine thin film

AU - Tang, Xiaodong

AU - Chen, Qiyang

AU - Gu, Donghong

AU - Gan, Fuxi

PY - 1995/12

Y1 - 1995/12

N2 - A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

AB - A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.

UR - https://www.scopus.com/pages/publications/0029519468

M3 - 文章

AN - SCOPUS:0029519468

SN - 0258-7025

VL - 22

SP - 925

EP - 929

JO - Zhongguo Jiguang/Chinese Journal of Lasers

JF - Zhongguo Jiguang/Chinese Journal of Lasers

IS - 12

ER -

Refractive index and absorption of an indium phthalocyanine thin film

Abstract

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