Abstract
A thin film of indium phthalocyanine (InPc) was obtained by vacuum deposition on single-crystal silicon. The ellipsometric spectra of the InPc thin film have been investigated on a scanning ellipsometer with the analyzer and polarizer rotating synchronously. It is revealed that there is a comparatively large absorption in the wavelength range of 600-800 nm. The spectrum is explained with its energy levels structure.
| Original language | English |
|---|---|
| Pages (from-to) | 925-929 |
| Number of pages | 5 |
| Journal | Zhongguo Jiguang/Chinese Journal of Lasers |
| Volume | 22 |
| Issue number | 12 |
| State | Published - Dec 1995 |
| Externally published | Yes |