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Recommended Methods to Study Resistive Switching Devices

  • Mario Lanza*
  • , H. S.Philip Wong
  • , Eric Pop
  • , Daniele Ielmini
  • , Dimitri Strukov
  • , Brian C. Regan
  • , Luca Larcher
  • , Marco A. Villena
  • , J. Joshua Yang
  • , Ludovic Goux
  • , Attilio Belmonte
  • , Yuchao Yang
  • , Francesco M. Puglisi
  • , Jinfeng Kang
  • , Blanka Magyari-Köpe
  • , Eilam Yalon
  • , Anthony Kenyon
  • , Mark Buckwell
  • , Adnan Mehonic
  • , Alexander Shluger
  • Haitong Li, Tuo Hung Hou, Boris Hudec, Deji Akinwande, Ruijing Ge, Stefano Ambrogio, Juan B. Roldan, Enrique Miranda, Jordi Suñe, Kin Leong Pey, Xing Wu, Nagarajan Raghavan, Ernest Wu, Wei D. Lu, Gabriele Navarro, Weidong Zhang, Huaqiang Wu, Runwei Li, Alexander Holleitner, Ursula Wurstbauer, Max C. Lemme, Ming Liu, Shibing Long, Qi Liu, Hangbing Lv, Andrea Padovani, Paolo Pavan, Ilia Valov, Xu Jing, Tingting Han, Kaichen Zhu, Shaochuan Chen, Fei Hui, Yuanyuan Shi
*Corresponding author for this work
  • Institute of Functional Nano & Soft Materials (FUNSOM)
  • Soochow University
  • Stanford University
  • Dipartimento di Elettronica
  • Polytechnic University of Milan
  • University of California at Santa Barbara
  • Department of Physics and Astronomy
  • University of California at Los Angeles
  • Dipartimento di Scienze e Metodi dell' Ingegneria
  • University of Modena and Reggio Emilia
  • University of Massachusetts
  • Interuniversitair Micro-Elektronica Centrum
  • Key Laboratory of Microelectronic Devices and Circuits
  • Peking University
  • Dipartimento di Ingegneria “Enzo Ferrari”
  • Department of Electronic & Electrical Engineering
  • University College London
  • Department of Physics and Astronomy
  • Department of Electronics Engineering and Institute of Electronics
  • National Yang Ming Chiao Tung University
  • University of Texas at Austin
  • IBM
  • Departamento de Electrónica y Tecnología de Computadores
  • University of Granada
  • Departament d'Enginyeria Electrònica
  • Autonomous University of Barcelona
  • Engineering Product Development Pillar
  • Singapore University of Technology and Design
  • University of Michigan, Ann Arbor
  • CEA-LETI
  • Commissariat à l’énergie atomique et aux énergies alternatives
  • Department of Electronics and Electrical Engineering
  • Liverpool John Moores University
  • Tsinghua University
  • Key Laboratory of Magnetic Materials and Devices
  • CAS - Ningbo Institute of Material Technology and Engineering
  • Technical University of Munich
  • Chair of Electronic Devices
  • RWTH Aachen University
  • Key Laboratory of Microelectronic Devices and Integrated Technology
  • CAS - Institute of Microelectronics
  • MDLab S.r.l.
  • Institut für Werkstoffe der Elektrotechnik 2

Research output: Contribution to journal › Review article › peer-review

Abstract

Resistive switching (RS) is an interesting property shown by some materials systems that, especially during the last decade, has gained a lot of interest for the fabrication of electronic devices, with electronic nonvolatile memories being those that have received the most attention. The presence and quality of the RS phenomenon in a materials system can be studied using different prototype cells, performing different experiments, displaying different figures of merit, and developing different computational analyses. Therefore, the real usefulness and impact of the findings presented in each study for the RS technology will be also different. This manuscript describes the most recommendable methodologies for the fabrication, characterization, and simulation of RS devices, as well as the proper methods to display the data obtained. The idea is to help the scientific community to evaluate the real usefulness and impact of an RS study for the development of RS technology.

Original languageEnglish
Article number1800143
JournalAdvanced Electronic Materials
Volume5
Issue number1
DOIs
StatePublished - Jan 2019

Keywords

  • electrical characterization
  • electronic synapses
  • nanofabrication
  • resistive random-access memories
  • resistive switching

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