Abstract
The characterization of impurities, defects, uniformity and some fundamental properties for the bulk and epitaxial HgCdTe (MCT) material, undoped and doped with Sb, As, Fe, have been investigated recently in the authors' laboratory by means of photoluminescence, magneto-photoconductivity, quantum capacitance spectroscopy, transport measurements, and other contactless and nondestructive methods such as the infrared, far-infrared, and millimeter wave measurements. This paper reports a portion of these new results.
| Original language | English |
|---|---|
| Pages (from-to) | 1176-1182 |
| Number of pages | 7 |
| Journal | Journal of Electronic Materials |
| Volume | 25 |
| Issue number | 8 |
| DOIs | |
| State | Published - Aug 1996 |
| Externally published | Yes |
Keywords
- As impurity
- Electrical properties
- HgCdTe
- Lifetimes
- Photoluminescence
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