Recent progress on HgCdTe at the national laboratory for infrared physics in China

Junhao Chu*, Dingyuan Tang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

The characterization of impurities, defects, uniformity and some fundamental properties for the bulk and epitaxial HgCdTe (MCT) material, undoped and doped with Sb, As, Fe, have been investigated recently in the authors' laboratory by means of photoluminescence, magneto-photoconductivity, quantum capacitance spectroscopy, transport measurements, and other contactless and nondestructive methods such as the infrared, far-infrared, and millimeter wave measurements. This paper reports a portion of these new results.

Original languageEnglish
Pages (from-to)1176-1182
Number of pages7
JournalJournal of Electronic Materials
Volume25
Issue number8
DOIs
StatePublished - Aug 1996
Externally publishedYes

Keywords

  • As impurity
  • Electrical properties
  • HgCdTe
  • Lifetimes
  • Photoluminescence

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