Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications

Zhaohao Zhang, Guoliang Tian, Jiali Huo, Fang Zhang, Qingzhu Zhang, Gaobo Xu, Zhenhua Wu, Yan Cheng, Yan Liu, Huaxiang Yin

Research output: Contribution to journalReview articlepeer-review

19 Scopus citations

Abstract

Hafnium oxide-based ferroelectric field-effect-transistors (FeFET), which combine super-steep logical switching and low power non-volatile memory functions, have significant potential for post-Moore integrated circuit innovations with higher energy efficiency and larger integration scale. In this review, recent research into hafnium oxide-based ferroelectric (FE) films and different functional devices is presented, from fundamentals to applications. Different technological challenges and state-of-the-art research and development efforts related to the physical understanding and performance optimization of FE films, advanced hafnium oxide-based device integration, and device applications in logic-in-memory and artificial synapses and neurons for neuromorphic computing are addressed.

Original languageEnglish
Article number200405
JournalScience China Information Sciences
Volume66
Issue number10
DOIs
StatePublished - Oct 2023

Keywords

  • FeFET
  • HZO
  • ferroelectric
  • hafnium oxide
  • logic-in-memory
  • neuromorphic computing

Fingerprint

Dive into the research topics of 'Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications'. Together they form a unique fingerprint.

Cite this