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Recent progress of hafnium oxide-based ferroelectric devices for advanced circuit applications

  • Zhaohao Zhang
  • , Guoliang Tian
  • , Jiali Huo
  • , Fang Zhang
  • , Qingzhu Zhang
  • , Gaobo Xu
  • , Zhenhua Wu
  • , Yan Cheng
  • , Yan Liu
  • , Huaxiang Yin*
  • *Corresponding author for this work
  • CAS - Institute of Microelectronics
  • University of Chinese Academy of Sciences
  • Xidian University

Research output: Contribution to journalReview articlepeer-review

Abstract

Hafnium oxide-based ferroelectric field-effect-transistors (FeFET), which combine super-steep logical switching and low power non-volatile memory functions, have significant potential for post-Moore integrated circuit innovations with higher energy efficiency and larger integration scale. In this review, recent research into hafnium oxide-based ferroelectric (FE) films and different functional devices is presented, from fundamentals to applications. Different technological challenges and state-of-the-art research and development efforts related to the physical understanding and performance optimization of FE films, advanced hafnium oxide-based device integration, and device applications in logic-in-memory and artificial synapses and neurons for neuromorphic computing are addressed.

Original languageEnglish
Article number200405
JournalScience China Information Sciences
Volume66
Issue number10
DOIs
StatePublished - Oct 2023

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

  1. SDG 7 - Affordable and Clean Energy
    SDG 7 Affordable and Clean Energy

Keywords

  • FeFET
  • HZO
  • ferroelectric
  • hafnium oxide
  • logic-in-memory
  • neuromorphic computing

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