Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm

Jun Shao; Lu Chen; Xiang Lü; Wei Lu; Li He; Shaoling Guo; Junhao Chu

doi:10.1063/1.3193546

Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm

Jun Shao^*
, Lu Chen
, Xiang Lü
, Wei Lu
, Li He
, Shaoling Guo
, Junhao Chu

^*Corresponding author for this work

School of Physics and Electronic Science

CAS - Shanghai Institute of Technical Physics

Research output: Contribution to journal › Article › peer-review

32 Scopus citations

Abstract

The application of photoreflectance (PR) spectroscopy had been for long time restricted to short-wavelength spectral region and was recently pushed to long wave infrared about 9 μm. In this letter, PR measurement in the very-long wave infrared of up to 20 μm is demonstrated by a step-scan Fourier transform infrared spectrometer-based technique. An arsenic-doped narrow-gap HgCdTe epilayer is measured at 77 K, the resultant infrared PR spectrum is analyzed by line shape function, and donor and acceptor levels are discussed with aid of photoluminescence measurement at nominally identical temperature. The results suggest promising application of PR spectroscopy in the very-long wave infrared spectral region.

Original language	English
Article number	041908
Journal	Applied Physics Letters
Volume	95
Issue number	4
DOIs	https://doi.org/10.1063/1.3193546
State	Published - 2009

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10.1063/1.3193546

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@article{d2612b32f15345e3894fd971d769a3cb,

title = "Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm",

abstract = "The application of photoreflectance (PR) spectroscopy had been for long time restricted to short-wavelength spectral region and was recently pushed to long wave infrared about 9 μm. In this letter, PR measurement in the very-long wave infrared of up to 20 μm is demonstrated by a step-scan Fourier transform infrared spectrometer-based technique. An arsenic-doped narrow-gap HgCdTe epilayer is measured at 77 K, the resultant infrared PR spectrum is analyzed by line shape function, and donor and acceptor levels are discussed with aid of photoluminescence measurement at nominally identical temperature. The results suggest promising application of PR spectroscopy in the very-long wave infrared spectral region.",

author = "Jun Shao and Lu Chen and Xiang L{\"u} and Wei Lu and Li He and Shaoling Guo and Junhao Chu",

year = "2009",

doi = "10.1063/1.3193546",

language = "英语",

volume = "95",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "4",

}

TY - JOUR

T1 - Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm

AU - Shao, Jun

AU - Chen, Lu

AU - Lü, Xiang

AU - Lu, Wei

AU - He, Li

AU - Guo, Shaoling

AU - Chu, Junhao

PY - 2009

Y1 - 2009

N2 - The application of photoreflectance (PR) spectroscopy had been for long time restricted to short-wavelength spectral region and was recently pushed to long wave infrared about 9 μm. In this letter, PR measurement in the very-long wave infrared of up to 20 μm is demonstrated by a step-scan Fourier transform infrared spectrometer-based technique. An arsenic-doped narrow-gap HgCdTe epilayer is measured at 77 K, the resultant infrared PR spectrum is analyzed by line shape function, and donor and acceptor levels are discussed with aid of photoluminescence measurement at nominally identical temperature. The results suggest promising application of PR spectroscopy in the very-long wave infrared spectral region.

AB - The application of photoreflectance (PR) spectroscopy had been for long time restricted to short-wavelength spectral region and was recently pushed to long wave infrared about 9 μm. In this letter, PR measurement in the very-long wave infrared of up to 20 μm is demonstrated by a step-scan Fourier transform infrared spectrometer-based technique. An arsenic-doped narrow-gap HgCdTe epilayer is measured at 77 K, the resultant infrared PR spectrum is analyzed by line shape function, and donor and acceptor levels are discussed with aid of photoluminescence measurement at nominally identical temperature. The results suggest promising application of PR spectroscopy in the very-long wave infrared spectral region.

UR - https://www.scopus.com/pages/publications/68249091837

U2 - 10.1063/1.3193546

DO - 10.1063/1.3193546

M3 - 文章

AN - SCOPUS:68249091837

SN - 0003-6951

VL - 95

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 4

M1 - 041908

ER -

Realization of photoreflectance spectroscopy in very-long wave infrared of up to 20 μm

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