TY - GEN
T1 - Real-IAD
T2 - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
AU - Wang, Chengjie
AU - Zhu, Wenbing
AU - Gao, Bin Bin
AU - Gan, Zhenye
AU - Zhang, Jiangning
AU - Gu, Zhihao
AU - Qian, Shuguang
AU - Chen, Mingang
AU - Ma, Lizhuang
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - Industrial anomaly detection (I AD) has garnered signif-icant attention and experienced rapid development. However, the recent development of I AD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real- I AD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Indus-trial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular I AD methods on the Real- I AD dataset, providing a highly challenging benchmark to promote the development of the I AD field.
AB - Industrial anomaly detection (I AD) has garnered signif-icant attention and experienced rapid development. However, the recent development of I AD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real- I AD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Indus-trial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular I AD methods on the Real- I AD dataset, providing a highly challenging benchmark to promote the development of the I AD field.
UR - https://www.scopus.com/pages/publications/85200696138
U2 - 10.1109/CVPR52733.2024.02159
DO - 10.1109/CVPR52733.2024.02159
M3 - 会议稿件
AN - SCOPUS:85200696138
SN - 9798350353006
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 22883
EP - 22892
BT - Proceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
PB - IEEE Computer Society
Y2 - 16 June 2024 through 22 June 2024
ER -