Real-IAD: A Real-World Multi-View Dataset for Benchmarking Versatile Industrial Anomaly Detection

  • Chengjie Wang
  • , Wenbing Zhu
  • , Bin Bin Gao
  • , Zhenye Gan
  • , Jiangning Zhang
  • , Zhihao Gu
  • , Shuguang Qian
  • , Mingang Chen
  • , Lizhuang Ma*
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

64 Scopus citations

Abstract

Industrial anomaly detection (I AD) has garnered signif-icant attention and experienced rapid development. However, the recent development of I AD approach has encountered certain difficulties due to dataset limitations. On the one hand, most of the state-of-the-art methods have achieved saturation (over 99% in AUROC) on mainstream datasets such as MVTec, and the differences of methods cannot be well distinguished, leading to a significant gap between public datasets and actual application scenarios. On the other hand, the research on various new practical anomaly detection settings is limited by the scale of the dataset, posing a risk of overfitting in evaluation results. Therefore, we propose a large-scale, Real-world, and multi-view Industrial Anomaly Detection dataset, named Real- I AD, which contains 150K high-resolution images of 30 different objects, an order of magnitude larger than existing datasets. It has a larger range of defect area and ratio proportions, making it more challenging than previous datasets. To make the dataset closer to real application scenarios, we adopted a multi-view shooting method and proposed sample-level evaluation metrics. In addition, beyond the general unsupervised anomaly detection setting, we propose a new setting for Fully Unsupervised Indus-trial Anomaly Detection (FUIAD) based on the observation that the yield rate in industrial production is usually greater than 60%, which has more practical application value. Finally, we report the results of popular I AD methods on the Real- I AD dataset, providing a highly challenging benchmark to promote the development of the I AD field.

Original languageEnglish
Title of host publicationProceedings - 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
PublisherIEEE Computer Society
Pages22883-22892
Number of pages10
ISBN (Electronic)9798350353006
ISBN (Print)9798350353006
DOIs
StatePublished - 2024
Externally publishedYes
Event2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024 - Seattle, United States
Duration: 16 Jun 202422 Jun 2024

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
ISSN (Print)1063-6919

Conference

Conference2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2024
Country/TerritoryUnited States
CitySeattle
Period16/06/2422/06/24

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