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Raman studies of tetrahedral amorphous carbon films deposited by filtered cathodic vacuum arc

  • B. K. Tay
  • , X. Shi
  • , H. S. Tan
  • , H. S. Yang
  • , Z. Sun
  • Unknown

Research output: Contribution to journalArticlepeer-review

Abstract

Raman spectra of tetrahedral amorphous carbon (ta-C) films have been obtained as a function of impinging carbon ion energy. In order to analyze the spectra quantitatively, the Raman spectra were fitted using a least-squares computer program. The relative Raman intensity is found to decrease with increasing sp3/sp2 bonding ratio in the films. In particular, the parameters from the fits show a strong correlation between the relative intensity ratio and the sp3 fraction.

Original languageEnglish
Pages (from-to)155-158
Number of pages4
JournalSurface and Coatings Technology
Volume105
Issue number1-2
DOIs
StatePublished - 5 Jun 1998
Externally publishedYes

Keywords

  • Cathodic vacuum arc
  • Raman studies
  • Tetrahedral amorphous carbon films

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