Raman spectroscopy characterization of two-dimensional materials

  • Fang Liang
  • , Hejun Xu
  • , Xing Wu*
  • , Chaolun Wang
  • , Chen Luo
  • , Jian Zhang
  • *Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

59 Scopus citations

Abstract

Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.

Original languageEnglish
Article number037802
JournalChinese Physics B
Volume27
Issue number3
DOIs
StatePublished - Mar 2018

Keywords

  • 2D materials
  • Raman
  • non-destructive characterization

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